Biaxiality and temperature dependence of 3- and 4-layer intermediate smectic-phase structures as revealed by resonant X-ray scattering

N. W. Roberts, S. Jaradat, L. S. Hirst, M. S. Thurlow, Y. Wang, S. T. Wang, Z. Q. Liu, C. C. Huang, J. Bai, R. Pindak, H. F. Gleeson

Research output: Contribution to journalArticlepeer-review

31 Scopus citations

Abstract

High-resolution resonant X-ray diffraction experiments have been performed on free-standing films of two selenium-containing antiferroelectric liquid-crystal mixtures. Optical studies had indicated that both mixtures exhibit exceptionally wide intermediate phases, over a total range of > 9 K. Through the structural information obtained from the resonant scattering data, we confirm that the intermediate phases of these mixtures show both 3-layer and 4-layer structural periodicities. Moreover, due to the stability of these phases, we report for the first time the temperature dependence of both the helicoidal pitch and distortion angle in the 3-layer phases deduced using the resonant X-ray technique. Analysis using an extension of the theory set out by Levelut and Pansu (LEVELUT A-M. and PANSU B., Phys. Rev. E, 60 (1999) 6803) shows that over the temperature ranges measured, the pitch changes linearly as a function of temperature whilst the distortion angle remains constant.

Original languageEnglish (US)
Pages (from-to)976-982
Number of pages7
JournalEurophysics Letters
Volume72
Issue number6
DOIs
StatePublished - Dec 15 2005

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