Band structure characterization of WS2 grown by chemical vapor deposition

  • Iori Tanabe
  • , Michael Gomez
  • , William C. Coley
  • , Duy Le
  • , Elena M. Echeverria
  • , Gordon Stecklein
  • , Viktor Kandyba
  • , Santosh K. Balijepalli
  • , Velveth Klee
  • , Ariana E. Nguyen
  • , Edwin Preciado
  • , I. Hsi Lu
  • , Sarah Bobek
  • , David Barroso
  • , Dominic Martinez-Ta
  • , Alexei Barinov
  • , Talat S. Rahman
  • , Peter A. Dowben
  • , Paul A. Crowell
  • , Ludwig Bartels

Research output: Contribution to journalArticlepeer-review

46 Scopus citations

Abstract

Growth by chemical vapor deposition (CVD) leads to multilayer WS2 of very high quality, based on high-resolution angle-resolved photoemission spectroscopy. The experimental valence band electronic structure is considered to be in good agreement with that obtained from density functional theory calculations. We find the spin-orbit splitting at the K̄ point to be 420 ± 20 meV with a hole effective mass of -0.35 ± 0.02 me for the upper spin-orbit component (the branch closer to the Fermi level) and -0.43 ± 0.07 me for the lower spin-orbit component. As predicted by theory, a thickness-dependent increase of bandwidth is observed at the top of the valence band, in the region of the Brillouin zone center. The top of the valence band of the CVD-prepared films exhibits a substantial binding energy, consistent with n-type behavior, and in agreement with transistor characteristics acquired using devices incorporating the same WS2 material.

Original languageEnglish (US)
Article number252103
JournalApplied Physics Letters
Volume108
Issue number25
DOIs
StatePublished - Jun 20 2016

Bibliographical note

Publisher Copyright:
© 2016 Author(s).

Fingerprint

Dive into the research topics of 'Band structure characterization of WS2 grown by chemical vapor deposition'. Together they form a unique fingerprint.

Cite this