Abstract
The recent discovery of topological insulators has uncovered exciting new quantum materials with potential applications in the emergent fields of topological spintronics and topological quantum computation. At the heart of uncovering the new physical properties of these materials is the characterization of their atomic structures, composition, defects, and interfaces. The technique of atomic-resolution analytical scanning transmission electron microscopy has already provided many insights and holds great promise for future discoveries. This perspective discusses advances that have been achieved in the atomic-scale characterization of topological insulators with a layered tetradymite structure, and it proposes future directions to link atomic-scale features to exciting new physical phenomena.
| Original language | English (US) |
|---|---|
| Article number | 070902 |
| Journal | APL Materials |
| Volume | 8 |
| Issue number | 7 |
| DOIs | |
| State | Published - Jul 1 2020 |
Bibliographical note
Funding Information:This project was supported by SMART, one of the seven centers of nCORE, a Semiconductor Research Corporation program, sponsored by NIST.
Publisher Copyright:
© 2020 Author(s).