Atomic level scanning transmission electron microscopy characterization of GaN/AlN quantum wells

Keyphrases

• Atomic Level 100%
• Quantum Well 100%
• Scanning Transmission Electron Microscopy 100%
• Electron Microscopy Characterization 100%
• Energy Loss 50%
• Electronic States 50%
• Loss Spectrum 50%
• Strain Effect 50%
• Beam Broadening 50%
• Beam Intensity 50%
• Multislice Calculations 50%
• Multiple Quantum Wells 50%
• Spectral States 50%

Engineering

• Quantum Well 100%
• Energy Dissipation 50%
• Broadening 50%
• Loss Spectrum 50%
• Effect of Strain 50%
• Measured Intensity 50%
• Electronic State 50%

Physics

• Quantum Wells 100%
• Transmission Electron Microscopy 100%
• Multiple Quantum Well 50%
• Effect of Strain 50%