Applications of aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy to thin oxide films and interfaces

Maria Varela, Jaume Gazquez, Andy R. Lupini, Julia T. Luck, Maria A. Torija, Manish Sharma, Chris Leighton, Mike D. Biegalski, Hans M. Christen, Matt Murfitt, Niklas Dellby, Ondrej Krivanek, Stephen J. Pennycook

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