Application of Uniplanar Structures for High Frequency Material Characterization

Can Eyup Akgun, Rhonda Franklin Drayton, Daniel I. Amey, Tim P. Mobley

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations

Abstract

In this paper, the dielectric properties (dielectric constant and loss tangent) of RF materials are evaluated using uniplanr resonator structures based on finite ground coplanar waveguides (FGCPWs). T- and ring resonators are simulated and experimentally verified up to 50 GHz.

Original languageEnglish (US)
Pages (from-to)621-626
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5288
StatePublished - 2003
Event2003 International Symposium on Microelectronics - Boston, MA, United States
Duration: Nov 18 2003Nov 20 2003

Fingerprint

Dive into the research topics of 'Application of Uniplanar Structures for High Frequency Material Characterization'. Together they form a unique fingerprint.

Cite this