Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1-x and Co2FeAl

A. T. Breidenbach; H. Yu; T. A. Peterson; A. P. Mcfadden; Bill K Peria; Chris Palmstrom; P. A. Crowell

doi:10.1103/physrevb.105.144405

Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1-x and Co2FeAl

A. T. Breidenbach, H. Yu, T. A. Peterson, A. P. Mcfadden, Bill K Peria, Chris Palmstrom, P. A. Crowell

Research output: Contribution to journal › Article › peer-review

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Abstract

We have measured the Seebeck and anomalous Nernst coefficients and corresponding transverse and longitudinal thermoelectric conductivities from 2 to 400 K in thin film (thickness t∼10 nm) Co2MnAlxSi1-x (0≤x≤1) and Co2FeAl grown by molecular beam epitaxy (MBE). A large (-14Am-1K-1 at 300 K) anomalous component of the transverse thermoelectric conductivity is observed in Co2MnAl, especially as contrasted to Co2MnSi (0.28 Am-1K-1 at 300 K). This enhancement is likely due to Weyl points close to the Fermi level of Co2MnAl which disappear as x decreases.

Original language	English (US)
Article number	144405
Journal	Physical Review B
Volume	105
Issue number	14
DOIs	https://doi.org/10.1103/physrevb.105.144405
State	Published - Apr 1 2022

Bibliographical note

Funding Information:
This work was supported by the National Science Foundation Grant No. DMR 1708287. The MBE sample growth was performed at University of California, Santa Barbara (UCSB) and was supported by U.S. Department of Energy (Contract No. DE-SC0014388). Devices for this paper were fabricated in the Minnesota Nano Center, which is supported by the National Science Foundation through the National Nano Coordinated Infrastructure Network (NNCI) under Award No. ECCS-2025124. Sample characterizations were performed in the Characterization Facility, University of Minnesota, which receives partial support from the NSF through the MRSEC (Award No. DMR-2011401) and the NNCI (Award No. ECCS-2025124) programs. We thank Professor E. Dan Dahlberg for advice about the collection of the AMR data.

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title = "Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1-x and Co2FeAl",

abstract = "We have measured the Seebeck and anomalous Nernst coefficients and corresponding transverse and longitudinal thermoelectric conductivities from 2 to 400 K in thin film (thickness t∼10 nm) Co2MnAlxSi1-x (0≤x≤1) and Co2FeAl grown by molecular beam epitaxy (MBE). A large (-14Am-1K-1 at 300 K) anomalous component of the transverse thermoelectric conductivity is observed in Co2MnAl, especially as contrasted to Co2MnSi (0.28 Am-1K-1 at 300 K). This enhancement is likely due to Weyl points close to the Fermi level of Co2MnAl which disappear as x decreases. ",

author = "Breidenbach, {A. T.} and H. Yu and Peterson, {T. A.} and Mcfadden, {A. P.} and Peria, {Bill K} and Chris Palmstrom and Crowell, {P. A.}",

note = "Funding Information: This work was supported by the National Science Foundation Grant No. DMR 1708287. The MBE sample growth was performed at University of California, Santa Barbara (UCSB) and was supported by U.S. Department of Energy (Contract No. DE-SC0014388). Devices for this paper were fabricated in the Minnesota Nano Center, which is supported by the National Science Foundation through the National Nano Coordinated Infrastructure Network (NNCI) under Award No. ECCS-2025124. Sample characterizations were performed in the Characterization Facility, University of Minnesota, which receives partial support from the NSF through the MRSEC (Award No. DMR-2011401) and the NNCI (Award No. ECCS-2025124) programs. We thank Professor E. Dan Dahlberg for advice about the collection of the AMR data. Publisher Copyright: {\textcopyright} 2022 American Physical Society. ",

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AU - Breidenbach, A. T.

AU - Yu, H.

AU - Peterson, T. A.

AU - Mcfadden, A. P.

AU - Peria, Bill K

AU - Palmstrom, Chris

AU - Crowell, P. A.

N1 - Funding Information: This work was supported by the National Science Foundation Grant No. DMR 1708287. The MBE sample growth was performed at University of California, Santa Barbara (UCSB) and was supported by U.S. Department of Energy (Contract No. DE-SC0014388). Devices for this paper were fabricated in the Minnesota Nano Center, which is supported by the National Science Foundation through the National Nano Coordinated Infrastructure Network (NNCI) under Award No. ECCS-2025124. Sample characterizations were performed in the Characterization Facility, University of Minnesota, which receives partial support from the NSF through the MRSEC (Award No. DMR-2011401) and the NNCI (Award No. ECCS-2025124) programs. We thank Professor E. Dan Dahlberg for advice about the collection of the AMR data. Publisher Copyright: © 2022 American Physical Society.

PY - 2022/4/1

Y1 - 2022/4/1

N2 - We have measured the Seebeck and anomalous Nernst coefficients and corresponding transverse and longitudinal thermoelectric conductivities from 2 to 400 K in thin film (thickness t∼10 nm) Co2MnAlxSi1-x (0≤x≤1) and Co2FeAl grown by molecular beam epitaxy (MBE). A large (-14Am-1K-1 at 300 K) anomalous component of the transverse thermoelectric conductivity is observed in Co2MnAl, especially as contrasted to Co2MnSi (0.28 Am-1K-1 at 300 K). This enhancement is likely due to Weyl points close to the Fermi level of Co2MnAl which disappear as x decreases.

AB - We have measured the Seebeck and anomalous Nernst coefficients and corresponding transverse and longitudinal thermoelectric conductivities from 2 to 400 K in thin film (thickness t∼10 nm) Co2MnAlxSi1-x (0≤x≤1) and Co2FeAl grown by molecular beam epitaxy (MBE). A large (-14Am-1K-1 at 300 K) anomalous component of the transverse thermoelectric conductivity is observed in Co2MnAl, especially as contrasted to Co2MnSi (0.28 Am-1K-1 at 300 K). This enhancement is likely due to Weyl points close to the Fermi level of Co2MnAl which disappear as x decreases.

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Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1-x and Co2FeAl

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Anomalous Nernst and Seebeck coefficients in epitaxial thin film Co2MnAlxSi1-x and Co2FeAl

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Bibliographical note

MRSEC Support

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