Analytical STEM study of P-doped silicon nanocrystals exhibiting mid-infrared localized surface plasmon resonance

J. S. Jeong, D. J. Rowe, U. R. Kortshagen, K. A. Mkhoyan

Research output: Contribution to journalComment/debatepeer-review

1 Scopus citations
Original languageEnglish (US)
Pages (from-to)1508
Number of pages1
JournalMicroscopy and Microanalysis
Volume19
DOIs
StatePublished - 2013

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