Abstract
A novel analytical approach for RLC interconnect performance analysis is developed. Using the gate and line geometries as inputs, we derive closed-form expressions for propagation delay, rise time, and voltage overshoot at both the driver output and the far end of the interconnect. This analytical approach enables fast and accurate RLC interconnect analysis and design optimization. Application to clock interconnect optimization is demonstrated and design guidelines are proposed.
Original language | English (US) |
---|---|
Title of host publication | Proceedings - 15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002 |
Editors | John Chickanosky, Ram K. Krishnamurthy, P.R. Mukund |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 353-357 |
Number of pages | 5 |
ISBN (Electronic) | 0780374940 |
DOIs | |
State | Published - 2002 |
Externally published | Yes |
Event | 15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002 - Rochester, United States Duration: Sep 25 2002 → Sep 28 2002 |
Publication series
Name | Proceedings of the Annual IEEE International ASIC Conference and Exhibit |
---|---|
Volume | 2002-January |
ISSN (Print) | 1063-0988 |
Conference
Conference | 15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002 |
---|---|
Country/Territory | United States |
City | Rochester |
Period | 9/25/02 → 9/28/02 |
Bibliographical note
Publisher Copyright:© 2002 IEEE.