Abstract
X-ray micro computed tomography and image analysis provides a novel, non-destructive method to visualize and characterize the pore structure of complex materials such as paper and board. Comparison of Z-directional structural details of hand sheet and commercially made fine paper samples show a distinct difference in pore size distribution both in the in-plane and transverse direction. Commercial sheets show significant variation through the thickness direction potentially owing to the non-uniformity during formation. Method presented here may provide a useful tool to the papermaker to truly engineer the structure of paper and board tailored to specific end-use applications.
| Original language | English (US) |
|---|---|
| Pages | 85-88 |
| Number of pages | 4 |
| State | Published - 2003 |
| Event | 2003 International Paper Physics Conference - Victoria, BC, Canada Duration: Sep 7 2003 → Sep 11 2003 |
Other
| Other | 2003 International Paper Physics Conference |
|---|---|
| Country/Territory | Canada |
| City | Victoria, BC |
| Period | 9/7/03 → 9/11/03 |