Analysis of scintillator crystal production via the edge-defined film-fed growth method

Andrew Yeckel, Robert S. Feigelson, Jeffrey J Derby

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

A model of edge-defined film-fed (EFG) crystal growth is developed to study melt growth of cylinders of the scintillator crystal cesium iodide (CsI). This system is characterized by strongly nonlinear interactions of heat transfer, capillarity, and die geometry that give rise to multiple solution states under a single set of operating conditions. A thermal-capillary instability is identified that stems from meniscus sag due to gravity, which causes an inection point to appear in the meniscus shape. This shape allows two solutions to coexist that correspond to different crystal diameters and gap sizes (axial length of liquid bridge between die and crystal). Also identified is an instability of convective heat transfer characterized by a strong interaction of thermal convection with the geometry of the growth interface.

Original languageEnglish (US)
Title of host publicationHard X-Ray, Gamma-Ray, and Neutron Detector Physics XV
DOIs
StatePublished - Nov 8 2013
EventSPIE Conference on Hard X-Ray, Gamma-Ray and Neutron Detector Physics XV - San Diego, CA, United States
Duration: Aug 26 2013Aug 28 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8852
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceSPIE Conference on Hard X-Ray, Gamma-Ray and Neutron Detector Physics XV
CountryUnited States
CitySan Diego, CA
Period8/26/138/28/13

Keywords

  • EFG method
  • Scintillator crystal growth
  • alkali halide
  • cesium iodide
  • edge-defined film-fed growth
  • shaped crystal growth

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  • Cite this

    Yeckel, A., Feigelson, R. S., & Derby, J. J. (2013). Analysis of scintillator crystal production via the edge-defined film-fed growth method. In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XV [88520V] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8852). https://doi.org/10.1117/12.2027535