An ultra-fast scheme for sample-detection in dynamic-mode atomic force microscopy

Deepak R. Sahoo, Abu Sebastian, Murti V. Salapaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

In typical dynamic mode operation of atomic force microscopes steady state signals like amplitude and phase are used for detection and imaging of material. In these methods, high quality factor of the cantilever results in high resolution, but low bandwidth and vice versa. In this paper we present a methodology that exploits the deflection signal during the transients of the cantilever motion. The principle overcomes the limitations on the trade off between resolution and bandwidth present in existing methods and makes it independent of the quality factor. Experimental results provided corroborate the theoretical development.

Original languageEnglish (US)
Title of host publication2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004
EditorsM. Laudon, B. Romanowicz
Pages11-14
Number of pages4
StatePublished - Nov 2 2004
Event2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004 - Boston, MA, United States
Duration: Mar 7 2004Mar 11 2004

Publication series

Name2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004
Volume3

Other

Other2004 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2004
CountryUnited States
CityBoston, MA
Period3/7/043/11/04

Keywords

  • Atomic force microscopy
  • Hypothesis testing
  • State observer
  • State-space model

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