An on-chip NBTI sensor for measuring PMOS threshold voltage degradation

Keyphrases

• On chip 100%
• PMOS 100%
• Negative Bias Temperature Instability 100%
• Threshold Voltage Degradation 100%
• Delay-locked Loop 40%
• Reliability Issues 20%
• CMOS Technology 20%
• Measurement Time 20%
• Operating Range 20%
• Device Reliability 20%
• PMOS Transistor 20%
• Control Voltage 20%
• AC Stress 20%
• Sensing Gain 20%
• DC Stress 20%
• Stress Mode 20%
• Maximum Gain 20%
• Scaled CMOS 20%

Engineering

• Negative-Bias Temperature Instability 100%
• Locked Loop 40%
• Reliability Issue 20%
• Using Sensor 20%
• Operating Range 20%
• Microsecond 20%
• Measurement Time 20%