An on-chip NBTI sensor for measuring pMOS threshold voltage degradation

Keyphrases

• On chip 100%
• PMOS 100%
• Negative Bias Temperature Instability 100%
• Threshold Voltage Degradation 100%
• CMOS Process 40%
• Threshold Voltage 40%
• Delay-locked Loop 40%
• Reliability Issues 20%
• Operating Conditions 20%
• 130 Nm CMOS 20%
• Voltage Shift 20%
• Measurement Time 20%
• Operating Range 20%
• Average Gain 20%
• Device Reliability 20%
• Bulk CMOS 20%
• Control Voltage 20%
• AC Stress 20%
• Sensing Gain 20%
• DC Stress 20%
• Voltage Recovery 20%
• Stress Mode 20%

Engineering

• Negative-Bias Temperature Instability 100%
• Locked Loop 40%
• Reliability Issue 20%
• Using Sensor 20%
• Operating Range 20%
• Microsecond 20%
• Measurement Time 20%