An on-chip monitor for statistically significant circuit aging characterization

John Keane, Wei Zhang, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Scopus citations

Abstract

We present an array-based system to accurately study variations in ROSC aging. Microsecond measurements for minimal BTI recovery, and frequency shift measurement resolution ranging down to the error floor of 0.07% are achieved with three beat frequency detection systems working in tandem. Measurement results from a 65nm test chip show that fresh frequency and Δf are uncorrelated, both the ? and ? of Δf increase with stress, and σ(Δf)/μ(Δf) decreases with stress time.

Original languageEnglish (US)
Title of host publication2010 IEEE International Electron Devices Meeting, IEDM 2010
Pages4.2.1-4.2.4
DOIs
StatePublished - Dec 1 2010
Event2010 IEEE International Electron Devices Meeting, IEDM 2010 - San Francisco, CA, United States
Duration: Dec 6 2010Dec 8 2010

Publication series

NameTechnical Digest - International Electron Devices Meeting, IEDM
ISSN (Print)0163-1918

Other

Other2010 IEEE International Electron Devices Meeting, IEDM 2010
CountryUnited States
CitySan Francisco, CA
Period12/6/1012/8/10

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