TY - GEN
T1 - An on-chip monitor for statistically significant circuit aging characterization
AU - Keane, John
AU - Zhang, Wei
AU - Kim, Chris H.
PY - 2010
Y1 - 2010
N2 - We present an array-based system to accurately study variations in ROSC aging. Microsecond measurements for minimal BTI recovery, and frequency shift measurement resolution ranging down to the error floor of 0.07% are achieved with three beat frequency detection systems working in tandem. Measurement results from a 65nm test chip show that fresh frequency and Δf are uncorrelated, both the ? and ? of Δf increase with stress, and σ(Δf)/μ(Δf) decreases with stress time.
AB - We present an array-based system to accurately study variations in ROSC aging. Microsecond measurements for minimal BTI recovery, and frequency shift measurement resolution ranging down to the error floor of 0.07% are achieved with three beat frequency detection systems working in tandem. Measurement results from a 65nm test chip show that fresh frequency and Δf are uncorrelated, both the ? and ? of Δf increase with stress, and σ(Δf)/μ(Δf) decreases with stress time.
UR - http://www.scopus.com/inward/record.url?scp=79951834999&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79951834999&partnerID=8YFLogxK
U2 - 10.1109/IEDM.2010.5703293
DO - 10.1109/IEDM.2010.5703293
M3 - Conference contribution
AN - SCOPUS:79951834999
SN - 9781424474196
T3 - Technical Digest - International Electron Devices Meeting, IEDM
SP - 4.2.1-4.2.4
BT - 2010 IEEE International Electron Devices Meeting, IEDM 2010
T2 - 2010 IEEE International Electron Devices Meeting, IEDM 2010
Y2 - 6 December 2010 through 8 December 2010
ER -