An array-based Chip Lifetime Predictor macro for gate dielectric failures in core and IO FETs

Keyphrases

• Gate Dielectric 100%
• Array-based 100%
• Dielectric Failure 100%
• Low Voltage 50%
• Silicon Area 50%
• Supply Voltage 50%
• Stress-driven 50%
• Time-area 50%
• IOS Apps 50%
• Dielectric Breakdown 50%
• Breakdown Mode 50%
• Lifetime Prediction 50%
• Off-state 50%
• On-state 50%

Material Science

• Field Effect Transistors 100%
• Dielectric Material 100%
• Silicon 33%
• Electrical Breakdown 33%

Engineering

• Field Effect Transistors 100%
• Gate Dielectric 100%
• Dielectrics 33%
• Supply Voltage 33%