An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array

Gyusung Park, Hanzhao Yu, Minsu Kim, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

An on-chip reliability monitor capable of characterizing all four bias temperature instability (BTI) modes is proposed. Stressed ring oscillators with independent dual power rails are implemented in which odd and even stages of an inverter chain are subject to different stress voltage configurations. A beat frequency detection technique with 3 reference ring oscillators achieves a frequency measurement resolution as low as 0.01% with a short measurement interruption time of 4μ s. Extensive BTI data collected from a 65nm ROSC array is presented for different stress conditions.

Original languageEnglish (US)
Title of host publication2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728168937
DOIs
StatePublished - Mar 2021
Event2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Virtual, Monterey, United States
Duration: Mar 21 2021Mar 24 2021

Publication series

Name2021 IEEE International Reliability Physics Symposium (IRPS)

Conference

Conference2021 IEEE International Reliability Physics Symposium, IRPS 2021
Country/TerritoryUnited States
CityVirtual, Monterey
Period3/21/213/24/21

Bibliographical note

Funding Information:
ACKNOWLEDGMENT This work was supported in part by Semiconductor Research Corporation Task No. 2712.017 through the Texas Analog Center of Excellence (TxACE). The authors would also like to thank Drs. Vijay Reddy and Srikanth Krishnan at Texas Instruments for introducing PMOS PBTI issues to us and for the technical feedback and encouragement throughout the project.

Publisher Copyright:
© 2021 IEEE.

Keywords

  • Bias temperature instability (BTI)
  • dual power rail
  • odometer
  • ring oscillator array

Fingerprint

Dive into the research topics of 'An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array'. Together they form a unique fingerprint.

Cite this