An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array

Gyusung Park; Hanzhao Yu; Minsu Kim; Chris H. Kim

doi:10.1109/irps46558.2021.9405181

An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array

Gyusung Park, Hanzhao Yu, Minsu Kim, Chris H. Kim

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

An on-chip reliability monitor capable of characterizing all four bias temperature instability (BTI) modes is proposed. Stressed ring oscillators with independent dual power rails are implemented in which odd and even stages of an inverter chain are subject to different stress voltage configurations. A beat frequency detection technique with 3 reference ring oscillators achieves a frequency measurement resolution as low as 0.01% with a short measurement interruption time of 4μ s. Extensive BTI data collected from a 65nm ROSC array is presented for different stress conditions.

Original language	English (US)
Title of host publication	2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728168937
DOIs	https://doi.org/10.1109/irps46558.2021.9405181
State	Published - Mar 2021
Event	2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Virtual, Monterey, United States Duration: Mar 21 2021 → Mar 24 2021

Publication series

Name	2021 IEEE International Reliability Physics Symposium (IRPS)

Conference

Conference	2021 IEEE International Reliability Physics Symposium, IRPS 2021
Country/Territory	United States
City	Virtual, Monterey
Period	3/21/21 → 3/24/21

Bibliographical note

Funding Information:
ACKNOWLEDGMENT This work was supported in part by Semiconductor Research Corporation Task No. 2712.017 through the Texas Analog Center of Excellence (TxACE). The authors would also like to thank Drs. Vijay Reddy and Srikanth Krishnan at Texas Instruments for introducing PMOS PBTI issues to us and for the technical feedback and encouragement throughout the project.

Publisher Copyright:
© 2021 IEEE.

Keywords

Bias temperature instability (BTI)
dual power rail
odometer
ring oscillator array

Publisher link

10.1109/irps46558.2021.9405181

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Park, G., Yu, H., Kim, M., & Kim, C. H. (2021). An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array. In 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings Article 9405181 (2021 IEEE International Reliability Physics Symposium (IRPS)). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/irps46558.2021.9405181

An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array. / Park, Gyusung; Yu, Hanzhao; Kim, Minsu et al.
2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. 9405181 (2021 IEEE International Reliability Physics Symposium (IRPS)).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Park, G, Yu, H, Kim, M & Kim, CH 2021, An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array. in 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings., 9405181, 2021 IEEE International Reliability Physics Symposium (IRPS), Institute of Electrical and Electronics Engineers Inc., 2021 IEEE International Reliability Physics Symposium, IRPS 2021, Virtual, Monterey, United States, 3/21/21. https://doi.org/10.1109/irps46558.2021.9405181

Park G, Yu H, Kim M, Kim CH. An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array. In 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2021. 9405181. (2021 IEEE International Reliability Physics Symposium (IRPS)). doi: 10.1109/irps46558.2021.9405181

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abstract = "An on-chip reliability monitor capable of characterizing all four bias temperature instability (BTI) modes is proposed. Stressed ring oscillators with independent dual power rails are implemented in which odd and even stages of an inverter chain are subject to different stress voltage configurations. A beat frequency detection technique with 3 reference ring oscillators achieves a frequency measurement resolution as low as 0.01% with a short measurement interruption time of 4μ s. Extensive BTI data collected from a 65nm ROSC array is presented for different stress conditions.",

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note = "Funding Information: ACKNOWLEDGMENT This work was supported in part by Semiconductor Research Corporation Task No. 2712.017 through the Texas Analog Center of Excellence (TxACE). The authors would also like to thank Drs. Vijay Reddy and Srikanth Krishnan at Texas Instruments for introducing PMOS PBTI issues to us and for the technical feedback and encouragement throughout the project. Publisher Copyright: {\textcopyright} 2021 IEEE.; 2021 IEEE International Reliability Physics Symposium, IRPS 2021 ; Conference date: 21-03-2021 Through 24-03-2021",

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An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array

Abstract

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