Aging statistics based on trapping/detrapping: Compact modeling and silicon validation

Keyphrases

• Advanced Technology Node 25%
• Age Prediction 50%
• Aging 100%
• Aging Model 25%
• Aging Process 25%
• Aging Rate 25%
• Circuit Level 25%
• Compact Modeling 100%
• Design Reliability 25%
• Design Steps 25%
• Detrapping 100%
• Device Data 25%
• Guard 25%
• Lifetime Prediction 25%
• Log-t 75%
• Long-term Reliability 25%
• Long-time Behavior 25%
• Model Validation 100%
• Multiple Devices 25%
• Negative Bias Temperature Instability 50%
• PMOS 25%
• Polylogarithmic Time 25%
• Power Law 25%
• Prediction Method 25%
• Protection Strategy 25%
• Reliability Issues 25%
• Reliability Prediction 25%
• Ring Oscillator 25%
• Short-term Stress 50%
• Silicon Validation 100%
• Single Device 25%
• Statistical Methods 100%
• Stress Measurement 25%
• Threshold Voltage 25%
• Time Dependence 25%
• Vth Shift 25%

Engineering

• Design for Reliability 50%
• Design Stage 50%
• Design Step 50%
• Negative-Bias Temperature Instability 100%
• Nodes 50%
• Oscillator 50%
• Protection Strategy 50%
• Reliability Issue 50%
• Reliability Prediction 50%
• Single Device 50%
• Term Behavior 50%