Original language | English (US) |
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Pages (from-to) | 862-863 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 18 |
DOIs | |
State | Published - Jul 2012 |
AFM Transverse Shear as a Probe of Crystallinity at the Interface of Gate Insulator and Organic Semiconductor
V. Kalihari, D. J. Ellison, G. Haugstad, C. D. Frisbie
Research output: Contribution to journal › Article › peer-review