AFM Transverse Shear as a Probe of Crystallinity at the Interface of Gate Insulator and Organic Semiconductor

V. Kalihari, D. J. Ellison, G. Haugstad, C. D. Frisbie

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)862-863
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
StatePublished - Jul 2012

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