Accessing intermediate ferroelectric switching regimes with time-resolved transmission electron microscopy

Keyphrases

• Time-resolved 100%
• Transmission Electron Microscopy 100%
• Ferroelectric Switching 100%
• Switching Regime 100%
• BiFeO3 100%
• In Situ Transmission Electron Microscopy 40%
• Applied Electric Field 40%
• Scanning Probe Techniques 40%
• Ferroelectric Domains 40%
• Spatial Resolution 20%
• High Spatial Resolution 20%
• High Temporal Resolution 20%
• Structural Defects 20%
• Complex Dynamics 20%
• Spintronic Devices 20%
• Domain nucleation 20%
• Structure Form 20%
• Electron Microscopy Techniques 20%
• Domain Switching 20%
• Magnetic Domain Structure 20%
• Switching Model 20%
• Extended Defects 20%
• Ferroelectric Materials 20%
• Magnetoelectric Coupling 20%
• High-order Methods 20%
• BiFeO3 Thin Film 20%
• Magnetoelectric multiferroics 20%
• Domain Propagation 20%
• Ferroelectric Domain Structure 20%
• Spintronic Sensor 20%
• Ferroelectric Structure 20%
• Nucleation-limited Switching 20%

Engineering

• Applied Electric Field 100%
• Spatial Resolution 100%
• Scanning Probe Technique 100%
• Magnetoelectronics 50%
• Transients 50%
• Length Scale 50%
• Structural Defect 50%
• Thin Films 50%
• High Resolution 50%
• Magnetic Domain 50%
• Domain Structure 50%
• Extended Defect 50%
• Temporal Resolution 50%

Material Science

• Ferroelectric Material 100%
• Transmission Electron Microscopy 100%
• Nucleation 37%
• Multiferroic Material 12%
• Thin Films 12%