Accelerated aging in analog and digital circuits with feedback

Keyphrases

• Digital Circuits 100%
• Dynamic Voltage Scaling 100%
• Analog Circuits 100%
• Failure Rate 100%
• Accelerated Aging 100%
• Bias Temperature Instability 100%
• CMOS Design 100%
• Channel Hot Carrier 100%
• Bias Runaway 100%
• System Dynamics 50%
• Catastrophic Events 50%
• Aging Model 50%
• Feedback Control 50%
• Analog Mixed-Signal 50%
• Logic Circuit 50%
• Mixed-signal Circuits 50%
• Underground Physics 50%
• Aging Mechanism 50%
• System Stability 50%
• Drain Voltage 50%
• Feedback System 50%
• Design Trade-offs 50%
• Accurate Simulation 50%
• Degradation Rate 50%
• Simulation Framework 50%
• Power Performance 50%
• Induced Acceleration 50%
• Framework Model 50%
• IC Design 50%
• Bias Circuit 50%
• Threshold Voltage Shift 50%
• Circuit Lifetime 50%
• Closed-loop Topology 50%
• Technology Scaling 50%

Engineering

• Digital Circuits 100%
• Voltage Scaling 100%
• Failure Rate 100%
• Closed Loop 50%
• Signal Circuit 50%
• Drain Voltage 50%
• Accurate Simulation 50%
• Logic Circuit 50%
• Design Trade 50%
• Integrated Circuit Design 50%
• Limiting Factor 50%
• Systems Stability 50%
• Boundary Condition 50%
• Feedback Control 50%
• Degradation Rate 50%