Absolute calibration of flats for densely sampled data

Marie Christine Zolcinski-Couet, Joseph A. Magner, David A. Zweig

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Results from a new technique for the absolute calibration of flats are presented. This technique is mathematically exact and, in addition, computationally nonintensive compared to previous techniques. Hence it allows the calibration of flats to a high degree of precision over the entire surface. The accuracy of this new technique is demonstrated through simulated test cases. This technique is currently implemented in the manufacturing cycle of optics (RMS precision of approximately λ/250 at a wavelength of .6328 microns).

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages81-88
Number of pages8
StatePublished - Dec 1 1995
EventOptical Manufacturing and Testing - San Diego, CA, USA
Duration: Jul 9 1995Jul 11 1995

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2536
ISSN (Print)0277-786X

Other

OtherOptical Manufacturing and Testing
CitySan Diego, CA, USA
Period7/9/957/11/95

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Zolcinski-Couet, M. C., Magner, J. A., & Zweig, D. A. (1995). Absolute calibration of flats for densely sampled data. In Proceedings of SPIE - The International Society for Optical Engineering (pp. 81-88). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2536).