A transmission electron microscopy study of the deformation behavior underneath nanoindents in nanoscale Al-TiN multilayered composites

D. Bhattacharyya, N. A. Mara, P. Dickerson, R. G. Hoagland, A. Misra

Research output: Contribution to journalArticle

35 Scopus citations

Abstract

Nanoscale multilayered Al-TiN composites were deposited using the dc magnetron sputtering technique in two different layer thickness ratios, Al : TiN = 1 : 1 and Al : TiN = 9 : 1. The Al layer thickness varied from 2 nm to 450 nm. The hardness of the samples was tested by nanoindentation using a Berkovich tip. Cross-sectional transmission electron microscopy (TEM) was carried out on samples extracted with focused ion beam from below the nanoindents. The results of the hardness tests on the Al-TiN multilayers with two different thickness ratios are presented, together with observations from the cross-sectional TEM studies of the regions underneath the indents. These studies revealed remarkable strength in the multilayers, as well as some very interesting deformation behavior in the TiN layers at extremely small length scales, where the hard TiN layers undergo co-deformation with the Al layers.

Original languageEnglish (US)
Pages (from-to)1711-1724
Number of pages14
JournalPhilosophical Magazine
Volume90
Issue number13
DOIs
StatePublished - May 2010

Keywords

  • Focused ion beam
  • Multilayer
  • Nanocomposite
  • Nanoindentation
  • Nanomechanics
  • Transmission electron microscopy

Fingerprint Dive into the research topics of 'A transmission electron microscopy study of the deformation behavior underneath nanoindents in nanoscale Al-TiN multilayered composites'. Together they form a unique fingerprint.

  • Cite this