A Technique for the Study of Gunn Devices at 9.1 GHz Using a Scanning Electron Microscope

A. Gopinath; M. S. Hill

doi:10.1109/T-ED.1973.17711

A Technique for the Study of Gunn Devices at 9.1 GHz Using a Scanning Electron Microscope

A. Gopinath, M. S. Hill

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

20 Scopus citations

Abstract

A scanning electron microscope operating in the stroboscopic mode has been used to observe dynamic voltage distributions in Gunn devices oscillating at 9.1 GHz and hence to examine domain motion. The technique used in the experiment is outlined and sample results presented.

Original language	English (US)
Pages (from-to)	610-612
Number of pages	3
Journal	IEEE Transactions on Electron Devices
Volume	20
Issue number	7
DOIs	https://doi.org/10.1109/T-ED.1973.17711
State	Published - Jul 1973

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10.1109/T-ED.1973.17711

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title = "A Technique for the Study of Gunn Devices at 9.1 GHz Using a Scanning Electron Microscope",

abstract = "A scanning electron microscope operating in the stroboscopic mode has been used to observe dynamic voltage distributions in Gunn devices oscillating at 9.1 GHz and hence to examine domain motion. The technique used in the experiment is outlined and sample results presented.",

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year = "1973",

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A Technique for the Study of Gunn Devices at 9.1 GHz Using a Scanning Electron Microscope

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