A simple sensitivity model for multiply interrogated and interferometric surface plasmon sensors

Brad Tiffany, James Leger

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Metal-film losses intrinsically limit the sensitivity of surface plasmon sensors. Interferometric and multiplexed systems can replace thermal noise limits with shot noise ones and fine-tune optimal operating conditions but cannot overcome this limit.

Original languageEnglish (US)
Title of host publicationOptical Fabrication and Testing, OFT 2008
PublisherOptical Society of America (OSA)
ISBN (Print)9781557528612
DOIs
StatePublished - 2008
EventOptical Fabrication and Testing, OFT 2008 - Rochester, NY, United States
Duration: Oct 21 2008Oct 24 2008

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherOptical Fabrication and Testing, OFT 2008
CountryUnited States
CityRochester, NY
Period10/21/0810/24/08

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  • Cite this

    Tiffany, B., & Leger, J. (2008). A simple sensitivity model for multiply interrogated and interferometric surface plasmon sensors. In Optical Fabrication and Testing, OFT 2008 (Optics InfoBase Conference Papers). Optical Society of America (OSA). https://doi.org/10.1364/oft.2008.jwd42