A powerless and non-volatile counterfeit IC detection sensor in a standard logic process based on an exposed floating-gate array

Muqing Liu, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Counterfeit ICs pose a threat to designing secure and reliable electronic systems. To better detect and prevent counterfeit ICs from entering the supply chain, an eflash based powerless non-volatile sensor using floating-gate (FG) technology is demonstrated in a 0.35μm standard logic process. By exposing the FG to the environment, the proposed sensor can record any physical tamper attempt affecting the charge stored on the exposed FG. Test results confirm that anomalous events such as temperature spikes, humidity changes, or increased dust particle density can be recorded by the sensor powerlessly, and later read out and analyzed whenever the power is available.

Original languageEnglish (US)
Title of host publication2017 Symposium on VLSI Technology, VLSI Technology 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
PagesT102-T103
ISBN (Electronic)9784863486058
DOIs
StatePublished - Jul 31 2017
Event37th Symposium on VLSI Technology, VLSI Technology 2017 - Kyoto, Japan
Duration: Jun 5 2017Jun 8 2017

Publication series

NameDigest of Technical Papers - Symposium on VLSI Technology
ISSN (Print)0743-1562

Other

Other37th Symposium on VLSI Technology, VLSI Technology 2017
CountryJapan
CityKyoto
Period6/5/176/8/17

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