Abstract
A Physical Unclonable Function (PUF) using capacitor mismatch in a standard successive approximation register analog-to-digital converter (SAR-ADC) as the entropy source is demonstrated in 65nm CMOS. SAR-ADCs are readily available in many system-on-chips, making the hardware overhead of the proposed PUF almost negligible. The inherent process variation of metal-oxide-metal (MOM) capacitors is harnessed through a charge redistribution operation which is sampled by the voltage comparator. To enhance the stability of the PUF output, soft response generation and dynamic thresholding techniques were adopted. Finally, we verify that performing the enrollment operation at a lower operating voltage can ensure that PUF responses are stable at the nominal supply voltage used during authentication.
Original language | English (US) |
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Title of host publication | 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781538648810 |
DOIs | |
State | Published - Apr 26 2018 |
Event | 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018 - Florence, Italy Duration: May 27 2018 → May 30 2018 |
Publication series
Name | Proceedings - IEEE International Symposium on Circuits and Systems |
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Volume | 2018-May |
ISSN (Print) | 0271-4310 |
Other
Other | 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018 |
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Country/Territory | Italy |
City | Florence |
Period | 5/27/18 → 5/30/18 |
Bibliographical note
Publisher Copyright:© 2018 IEEE.
Keywords
- Physical Unclonable Function (PUF)
- Successive Approximation (SAR) ADC
- capacitance variation
- charge redistribution