A new framework for X-ray photon correlation spectroscopy analysis from polycrystalline materials

Ronald M. Lewis, Grayson L. Jackson, Michael J. Maher, Kyungtae Kim, Timothy P. Lodge, Mahesh K. Mahanthappa, Suresh Narayanan, Frank S. Bates

Research output: Contribution to journalReview articlepeer-review

2 Scopus citations

Abstract

We report a new analytical framework for interpreting data from X-ray photon correlation spectroscopy measurements on polycrystalline materials characterized by strong scattering intensity variations at fixed wavevector magnitude (i.e., anisotropic scattering). Currently, no analytical method exists for the interpretation of the time-dependent anisotropic scattering from such materials. The framework is applied to interrogate the dynamics of a spherical micelle-forming diblock copolymer melt below the order-disorder transition, wherein finite size grains of a micellar body-centered cubic structure produce anisotropic scattering. A wealth of analytical information is recovered from a simple measurement, including distributions of relaxation times and speeds associated with micelles within grains. The findings of this study demonstrate the efficacy of this new analytical method, which may be readily adapted for application to a variety of materials and systems.

Original languageEnglish (US)
Article number123902
JournalReview of Scientific Instruments
Volume89
Issue number12
DOIs
StatePublished - Dec 1 2018

Bibliographical note

Funding Information:
Support for this work was provided by the National Science Foundation under Grant Nos. DMR-1104368, DMR-1801993, CHE-1608115, and DMR-17017578. SAXS experiments in the supplementary material were conducted at the Advanced Photon Source (APS). Use of the APS, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science by the Argonne National Laboratory, was supported by the U.S. DOE under Contract No. DE-AC02-06CH11357.

Publisher Copyright:
© 2018 Author(s).

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