A method to evaluate the skew by data dependent gate loading in VLSI system

Jiang Yanfeng, Zhang Xiaobo, Yang Bing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, the skew by data dependent gate loading has been analysized. A method based on the concept of MOS parametric capacitance has been proposed. According to different data dependent of the MOS transistor, including transient channel charge and Miller effects, the values of capacitance in different data loadings have been extracted. Two clock tree routes have been analyzed by using the gate loading effect. Results revealed that the simulation result including the gate loading approaches to the actual ones closely.

Original languageEnglish (US)
Title of host publicationProceedings of 2009 7th Asian Control Conference, ASCC 2009
Pages547-550
Number of pages4
StatePublished - Dec 11 2009
Event2009 7th Asian Control Conference, ASCC 2009 - Hong Kong, China
Duration: Aug 27 2009Aug 29 2009

Other

Other2009 7th Asian Control Conference, ASCC 2009
CountryChina
CityHong Kong
Period8/27/098/29/09

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  • Cite this

    Yanfeng, J., Xiaobo, Z., & Bing, Y. (2009). A method to evaluate the skew by data dependent gate loading in VLSI system. In Proceedings of 2009 7th Asian Control Conference, ASCC 2009 (pp. 547-550). [5276380]