A method to evaluate the skew by data dependent gate loading

Yanfeng Jiang; Xiaobo Zhang; Bing Yang; Jiaxin Ju

doi:10.1109/IPFA.2009.5232609

A method to evaluate the skew by data dependent gate loading

Yanfeng Jiang, Xiaobo Zhang, Bing Yang, Jiaxin Ju

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In this paper, the skew by data dependent gate loading has been analysized. A method based on the concept of MOS parametric capacitance has been proposed. According to different data dependent of the MOS transistor, including transient channel charge and Miller effects, the values of capacitance in different data loadings have been extracted. Two clock tree routes have been analyzed by using the gate loading effect. Results revealed that the simulation result including the gate loading approaches to the actual ones closely.

Original language	English (US)
Title of host publication	Proceedings of the 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009
Pages	451-454
Number of pages	4
DOIs	https://doi.org/10.1109/IPFA.2009.5232609
State	Published - Nov 16 2009
Event	2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009 - Suzhou, China Duration: Jul 6 2009 → Jul 10 2009

Publication series

Name	Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Other

Other	2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009
Country/Territory	China
City	Suzhou
Period	7/6/09 → 7/10/09

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10.1109/IPFA.2009.5232609

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Jiang, Y., Zhang, X., Yang, B., & Ju, J. (2009). A method to evaluate the skew by data dependent gate loading. In Proceedings of the 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009 (pp. 451-454). [5232609] (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA). https://doi.org/10.1109/IPFA.2009.5232609

A method to evaluate the skew by data dependent gate loading. / Jiang, Yanfeng; Zhang, Xiaobo; Yang, Bing et al.
Proceedings of the 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009. 2009. p. 451-454 5232609 (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Jiang, Y, Zhang, X, Yang, B & Ju, J 2009, A method to evaluate the skew by data dependent gate loading. in Proceedings of the 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009., 5232609, Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, pp. 451-454, 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009, Suzhou, China, 7/6/09. https://doi.org/10.1109/IPFA.2009.5232609

Jiang Y, Zhang X, Yang B, Ju J. A method to evaluate the skew by data dependent gate loading. In Proceedings of the 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009. 2009. p. 451-454. 5232609. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA). doi: 10.1109/IPFA.2009.5232609

Jiang, Yanfeng ; Zhang, Xiaobo ; Yang, Bing et al. / A method to evaluate the skew by data dependent gate loading. Proceedings of the 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009. 2009. pp. 451-454 (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

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title = "A method to evaluate the skew by data dependent gate loading",

abstract = "In this paper, the skew by data dependent gate loading has been analysized. A method based on the concept of MOS parametric capacitance has been proposed. According to different data dependent of the MOS transistor, including transient channel charge and Miller effects, the values of capacitance in different data loadings have been extracted. Two clock tree routes have been analyzed by using the gate loading effect. Results revealed that the simulation result including the gate loading approaches to the actual ones closely.",

author = "Yanfeng Jiang and Xiaobo Zhang and Bing Yang and Jiaxin Ju",

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AB - In this paper, the skew by data dependent gate loading has been analysized. A method based on the concept of MOS parametric capacitance has been proposed. According to different data dependent of the MOS transistor, including transient channel charge and Miller effects, the values of capacitance in different data loadings have been extracted. Two clock tree routes have been analyzed by using the gate loading effect. Results revealed that the simulation result including the gate loading approaches to the actual ones closely.

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A method to evaluate the skew by data dependent gate loading

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