A method of isolating voltage contrast in the scanning electron microscope

A. Gopinath; C. C. Sanger

doi:10.1088/0022-3735/4/8/017

A method of isolating voltage contrast in the scanning electron microscope

A. Gopinath, C. C. Sanger

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Original language	English (US)
Article number	017
Pages (from-to)	610-611
Number of pages	2
Journal	Journal of Physics E: Scientific Instruments
Volume	4
Issue number	8
DOIs	https://doi.org/10.1088/0022-3735/4/8/017
State	Published - Dec 1 1971

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10.1088/0022-3735/4/8/017

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title = "A method of isolating voltage contrast in the scanning electron microscope",

author = "A. Gopinath and Sanger, {C. C.}",

year = "1971",

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AU - Sanger, C. C.

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JF - Measurement Science and Technology

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A method of isolating voltage contrast in the scanning electron microscope

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