Abstract
This work experimentally demonstrates for the first time a True Random Number Generator (TRNG) based on the random switching probability of Magnetic Tunnel Junctions (MTJs). A conditional perturb and real-time output probability tracking scheme is proposed to enhance the reliability, speed, and power consumption while maintaining a 100% bit efficiency.
Original language | English (US) |
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Title of host publication | 2014 IEEE International Electron Devices Meeting, IEDM 2014 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 12.5.1-12.5.4 |
Edition | February |
ISBN (Electronic) | 9781479980017 |
DOIs | |
State | Published - Feb 20 2015 |
Event | 2014 60th IEEE International Electron Devices Meeting, IEDM 2014 - San Francisco, United States Duration: Dec 15 2014 → Dec 17 2014 |
Publication series
Name | Technical Digest - International Electron Devices Meeting, IEDM |
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Number | February |
Volume | 2015-February |
ISSN (Print) | 0163-1918 |
Other
Other | 2014 60th IEEE International Electron Devices Meeting, IEDM 2014 |
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Country/Territory | United States |
City | San Francisco |
Period | 12/15/14 → 12/17/14 |
Bibliographical note
Publisher Copyright:© 2014 IEEE.