A Magnetic Tunnel Junction based True Random Number Generator with conditional perturb and real-time output probability tracking

Won Ho Choi, Yang Lv, Jongyeon Kim, Abhishek Deshpande, Gyuseong Kang, Jian Ping Wang, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

39 Scopus citations

Abstract

This work experimentally demonstrates for the first time a True Random Number Generator (TRNG) based on the random switching probability of Magnetic Tunnel Junctions (MTJs). A conditional perturb and real-time output probability tracking scheme is proposed to enhance the reliability, speed, and power consumption while maintaining a 100% bit efficiency.

Original languageEnglish (US)
Title of host publication2014 IEEE International Electron Devices Meeting, IEDM 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages12.5.1-12.5.4
EditionFebruary
ISBN (Electronic)9781479980017
DOIs
StatePublished - Feb 20 2015
Event2014 60th IEEE International Electron Devices Meeting, IEDM 2014 - San Francisco, United States
Duration: Dec 15 2014Dec 17 2014

Publication series

NameTechnical Digest - International Electron Devices Meeting, IEDM
NumberFebruary
Volume2015-February
ISSN (Print)0163-1918

Other

Other2014 60th IEEE International Electron Devices Meeting, IEDM 2014
CountryUnited States
CitySan Francisco
Period12/15/1412/17/14

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