Keyphrases
Speed Variation
100%
Subthreshold Circuit
100%
Variation Tolerance
100%
Performance Enhancement
50%
Measurement Results
50%
Clock Skew
50%
Gate Voltage
50%
Temperature Variation
50%
CMOS Process
50%
Temperature Fluctuation
50%
Suprathreshold
50%
Clock Distribution Network
50%
Threshold Region
50%
Wire Delay
50%
Subthreshold Region
50%
Delay-sensitive
50%
Driver Transistor
50%
Delay Variation
50%
Operating Region
50%
Less Delay
50%
Process-voltage-temperature Variations
50%
Clock Tree
50%
3-sigma
50%
Process-voltage-temperature
50%
In(III)
50%
Fast Switching Speed
50%
Engineering
Capacitive
100%
Interconnects
100%
Fits and Tolerances
50%
Gate Voltage
50%
Temperature Fluctuation
50%
Switching Speed
50%
Clock Distribution Networks
50%
Operating Region
50%
Computer Science
Clock Skew
100%
Threshold Region
100%
Delay Variation
100%
Delay Sensitivity
100%
Clock Distribution Networks
100%