A high-resolution electron microscopy study of exsolution lamellae in enstatite

J. B.Vander Sande, D. L. Kohlstedt

Research output: Contribution to journalArticle

13 Scopus citations

Abstract

The interfaces between narrow augite exsolution lamellae and enstatite matrix are examined in detail by transmission electron microscopy using weak-beam and direct lattice imaging techniques. Direct observation of matrix planes with a (100) interplanar spacing (18-3 A) and the (200) lamella planes (4·6 Å) at the interfaoe between the two phases reveals steps or ledges usually one atomic plane high every few hundred Angstroms; growth of a lamella apparently involves the motion of ledges parallel to the interface. Terminating (200) lattice fringes, indicating the presence of a dislocation, are observed at each ledge. The dislocations, which are parallel to [010], also have an [001] component that stabilizes the structure by reducing the strain energy of the interface.

Original languageEnglish (US)
Pages (from-to)1041-1049
Number of pages9
JournalPhilosophical Magazine
Volume29
Issue number5
DOIs
StatePublished - May 1974

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