A framework for estimating NBTI degradation of microarchitectural components

Michael Debole; K. Ramakrishnan; Varsha Balakrishnan; Wenping Wang; Hong Luo; Yu Wang; Yuan Xie; Yu Cao; N. Vijaykrishnan

doi:10.1109/ASPDAC.2009.4796522

A framework for estimating NBTI degradation of microarchitectural components

Michael Debole
, K. Ramakrishnan
, Varsha Balakrishnan
, Wenping Wang
, Hong Luo
, Yu Wang
, Yuan Xie
, Yu Cao
, N. Vijaykrishnan

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

13 Scopus citations

Abstract

Degradation of device parameters over the lifetime of a system is emerging as a significant threat to system reliability. Among the aging mechanisms, wearout resulting from NBTI is of particular concern in deep submicron technology generations. To facilitate architectural level aging analysis, a tool capable of evaluating NBTI vulnerabilities early in the design cycle has been developed. The tool includes workload-based temperature and performance degradation analysis across a variety of technologies and operating conditions, revealing a complex interplay between factors influencing NBTI timing degradation.

Original language	English (US)
Title of host publication	Proceedings of the ASP-DAC 2009
Subtitle of host publication	Asia and South Pacific Design Automation Conference 2009
Pages	455-460
Number of pages	6
DOIs	https://doi.org/10.1109/ASPDAC.2009.4796522
State	Published - 2009
Externally published	Yes
Event	Asia and South Pacific Design Automation Conference 2009, ASP-DAC 2009 - Yokohama, Japan Duration: Jan 19 2009 → Jan 22 2009

Publication series

Name	Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Other

Other	Asia and South Pacific Design Automation Conference 2009, ASP-DAC 2009
Country/Territory	Japan
City	Yokohama
Period	1/19/09 → 1/22/09

Publisher link

10.1109/ASPDAC.2009.4796522

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Debole, M., Ramakrishnan, K., Balakrishnan, V., Wang, W., Luo, H., Wang, Y., Xie, Y., Cao, Y., & Vijaykrishnan, N. (2009). A framework for estimating NBTI degradation of microarchitectural components. In Proceedings of the ASP-DAC 2009: Asia and South Pacific Design Automation Conference 2009 (pp. 455-460). Article 4796522 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2009.4796522

A framework for estimating NBTI degradation of microarchitectural components. / Debole, Michael; Ramakrishnan, K.; Balakrishnan, Varsha et al.
Proceedings of the ASP-DAC 2009: Asia and South Pacific Design Automation Conference 2009. 2009. p. 455-460 4796522 (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Debole, M, Ramakrishnan, K, Balakrishnan, V, Wang, W, Luo, H, Wang, Y, Xie, Y, Cao, Y & Vijaykrishnan, N 2009, A framework for estimating NBTI degradation of microarchitectural components. in Proceedings of the ASP-DAC 2009: Asia and South Pacific Design Automation Conference 2009., 4796522, Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC, pp. 455-460, Asia and South Pacific Design Automation Conference 2009, ASP-DAC 2009, Yokohama, Japan, 1/19/09. https://doi.org/10.1109/ASPDAC.2009.4796522

Debole M, Ramakrishnan K, Balakrishnan V, Wang W, Luo H, Wang Y et al. A framework for estimating NBTI degradation of microarchitectural components. In Proceedings of the ASP-DAC 2009: Asia and South Pacific Design Automation Conference 2009. 2009. p. 455-460. 4796522. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). doi: 10.1109/ASPDAC.2009.4796522

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abstract = "Degradation of device parameters over the lifetime of a system is emerging as a significant threat to system reliability. Among the aging mechanisms, wearout resulting from NBTI is of particular concern in deep submicron technology generations. To facilitate architectural level aging analysis, a tool capable of evaluating NBTI vulnerabilities early in the design cycle has been developed. The tool includes workload-based temperature and performance degradation analysis across a variety of technologies and operating conditions, revealing a complex interplay between factors influencing NBTI timing degradation.",

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A framework for estimating NBTI degradation of microarchitectural components

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