A forward body-biased low-leakage SRAM cache: Device, circuit and architecture considerations

Chris H. Kim, Jae Joon Kim, Saibal Mukhopadhyay, Kaushik Roy

Research output: Contribution to journalArticlepeer-review

71 Scopus citations

Abstract

This paper presents a forward body-biasing (FBB) technique for active and standby leakage power reduction in cache memories. Unlike previous low-leakage SRAM approaches, we include device level optimization into the design. We utilize super high Vt (threshold voltage) devices to suppress the cache leakage power, while dynamically FBB only the selected SRAM cells for fast operation. In order to build a super high Vt device, the two-dimensional (2-D) halo doping profile was optimized considering various nanoscale leakage mechanisms. The transition latency and energy overhead associated with FBB was minimized by waking up the SRAM cells ahead of the access and exploiting the general cache access pattern. The combined device-circuit-architecture level techniques offer 64% total leakage reduction and 7.3% improvement in bit line delay compared to a previous state-of-the-art low-leakage SRAM technique. Static noise margin of the proposed SRAM cell is comparable to conventional SRAM cells.

Original languageEnglish (US)
Pages (from-to)349-357
Number of pages9
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume13
Issue number3
DOIs
StatePublished - Mar 2005

Bibliographical note

Funding Information:
Manuscript received October 24, 2003; revised March 23, 2004. This work was supported in part by the Semiconductor Research Corporation under Contract 2000-HJ-768, in part by the DARPA PAC/C Program, and in part by the Intel Ph.D. Fellowship Program.

Keywords

  • Forward body-biasing (FBB)
  • Halo doping
  • Leakage power
  • SRAM
  • Super high Vt

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