A finite weakest-link model of lifetime distribution of high-k gate dielectrics under unipolar AC voltage stress

Keyphrases

• Voltage Stress 100%
• High-k Gate Dielectrics 100%
• Lifetime Distribution 100%
• Weakest Link Model 100%
• AC Voltage 100%
• Gate Dielectric 33%
• Histogram 33%
• Weibull 33%
• Scaling Laws 33%
• HfO2 33%
• Oxide Layer 33%
• Mean Lifetime 33%
• Probability Distribution Function 33%
• Gate Oxide 33%
• Strength Statistics 33%
• Series Coupling 33%
• Fiber Bundle Model 33%

Engineering

• High-k gate dielectric 100%
• Scaling Law 50%
• Gate Oxide 50%
• Gate Dielectric 50%
• Histogram 50%
• Oxide Layer 50%
• Fibre Bundle Model 50%
• Probability Distribution Function 50%

Mathematics

• Lifetime Distribution 100%
• Fiber Bundle 50%
• Probability Distribution Function 50%
• Oxide Layer 50%
• Scaling Law 50%
• Histogram 50%