A finite-point method for efficient gate characterization under multiple input switching

Keyphrases

• Multiple Input Switching 100%
• Finite Point Method 100%
• Multiple Input 60%
• Static Timing Analysis 40%
• Operating Conditions 20%
• Point-based 20%
• Characterization Techniques 20%
• Operating Frequency 20%
• Process Variation 20%
• Computation Cost 20%
• Technology Node 20%
• Modeling Methodology 20%
• VLSI Design 20%
• Single Input 20%
• Benchmark Circuits 20%
• Computationally Intensive 20%
• Delay Variation 20%
• Logic Gates 20%
• Frequency Variation 20%
• 45 Nm CMOS Technology 20%
• Switching Model 20%
• SPICE Model 20%
• Operating Process 20%
• Input Switching 20%
• Switching Window 20%
• Timing Characterization 20%
• Technology Scaling 20%
• Switching Scenarios 20%

Engineering

• Input Multiple 100%
• Point Method 100%
• Nodes 12%
• Experimental Result 12%
• Data Volume 12%
• Operating Frequency 12%
• Flow Analysis 12%
• Logic Gate 12%
• SPICE 12%
• Process Variation 12%