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A ferroelectric semiconductor field-effect transistor
Mengwei Si
, Atanu K. Saha
, Shengjie Gao
,
Gang Qiu
, Jingkai Qin
, Yuqin Duan
, Jie Jian
, Chang Niu
, Haiyan Wang
, Wenzhuo Wu
, Sumeet K. Gupta
, Peide D. Ye
Research output
:
Contribution to journal
›
Article
›
peer-review
539
Scopus citations
Overview
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Keyphrases
Field-effect Transistors
100%
Ferroelectric Semiconductors
100%
In2Se3
66%
High Performance
33%
Transistor
33%
Low Voltage
33%
Atomic Layer Deposition
33%
Gate Dielectric
33%
Band Gap
33%
Polarization State
33%
Atomic Layers
33%
HfO2
33%
Al2O3 Oxide
33%
Channel Conductance
33%
Retention Time
33%
Channel Material
33%
Hafnium Oxide
33%
Gate Insulator
33%
Ferroelectric Materials
33%
Passivation Effect
33%
Large-area Growth
33%
Ferroelectric Field-effect Transistor (FeFET)
33%
Indium Selenide
33%
2D Ferroelectrics
33%
Room-temperature Ferroelectricity
33%
On-state Current
33%
High On-off Ratio
33%
Large Memory Window
33%
Nonvolatile Memory Technologies
33%
Engineering
Field-Effect Transistor
100%
Two Dimensional
33%
Nonvolatile Memory
33%
Gate Dielectric
33%
Channel Conductance
33%
Atomic Layer
33%
Passivation
33%
Polarization State
33%
Room Temperature
33%
Atomic Layer Deposition
33%
Supply Voltage
33%
Aluminum Oxide
33%
Retention Time
33%
Band Gap
33%
Material Science
Ferroelectric Material
100%
Field Effect Transistors
100%
Aluminum Oxide
40%
Ferroelectricity
40%
Transistor
20%
Indium
20%
Hafnium
20%
Oxide Compound
20%
Dielectric Material
20%