A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling

Orlin Melstrand; Ed O'neill; Gerald E. Sobelman; Dimitri Dokos

doi:10.1109/TCAD.1984.1270056

A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling

Orlin Melstrand
, Ed O'neill
, Gerald E. Sobelman
, Dimitri Dokos

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

An automated system has been developed for use in the characterization and modeling of MOS transistors. The system, consisting of automatic testing, a dynamic data base, and device parameter extraction, has been applied to process characterization and device modeling. The data base handles storage and retrieval of the data. Parameter extraction is based on optimization with constraints.

Original language	English (US)
Pages (from-to)	47-51
Number of pages	5
Journal	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume	3
Issue number	1
DOIs	https://doi.org/10.1109/TCAD.1984.1270056
State	Published - Jan 1984

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10.1109/TCAD.1984.1270056

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title = "A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling",

abstract = "An automated system has been developed for use in the characterization and modeling of MOS transistors. The system, consisting of automatic testing, a dynamic data base, and device parameter extraction, has been applied to process characterization and device modeling. The data base handles storage and retrieval of the data. Parameter extraction is based on optimization with constraints.",

author = "Orlin Melstrand and Ed O'neill and Sobelman, \{Gerald E.\} and Dimitri Dokos",

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AB - An automated system has been developed for use in the characterization and modeling of MOS transistors. The system, consisting of automatic testing, a dynamic data base, and device parameter extraction, has been applied to process characterization and device modeling. The data base handles storage and retrieval of the data. Parameter extraction is based on optimization with constraints.

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A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling

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