A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling

Orlin Melstrand, Ed O'neill, Gerald E. Sobelman, Dimitri Dokos

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

An automated system has been developed for use in the characterization and modeling of MOS transistors. The system, consisting of automatic testing, a dynamic data base, and device parameter extraction, has been applied to process characterization and device modeling. The data base handles storage and retrieval of the data. Parameter extraction is based on optimization with constraints.

Original languageEnglish (US)
Pages (from-to)47-51
Number of pages5
JournalIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume3
Issue number1
DOIs
StatePublished - Jan 1984

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