A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates

Rebecca L. Peterson; Rhonda F. Drayton

doi:10.1109/ARFTG.2001.327463

A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates

Rebecca L. Peterson, Rhonda F. Drayton

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

Abstract

The microstrip T-resonator is a well established tool for determining broadband electrical properties of microwave materials, namely effective dielectric constant and attenuation. In this paper finite ground coplanar waveguide (CPW) T-resonators on high resistivity silicon are presented and evaluated. The multi-moding seen in CPW T-junctions is effectively eliminated through the use of gold wire bonds. The calibration independence of the CPW T-resonator technique is demonstrated and the predicted impedance independence of the CPW "T" is experimentally validated. The electrical property results obtained using the T-resonator on high resistivity silicon substrates are in good agreement with data from other characterization techniques. The CPW T-resonator is thus shown to provide rapid and accurate characterization of integrated microwave substrates.

Original language	English (US)
Title of host publication	57th ARFTG Conference Digest Spring 2001
Subtitle of host publication	Best Practices and Strategies for RF Test, ARFTG Spring 2001
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	0780356861, 9780780356863
DOIs	https://doi.org/10.1109/ARFTG.2001.327463
State	Published - 2001
Event	57th Automatic RF Techniques Group Conference, ARFTG Spring 2001 - Phoenix, United States Duration: May 25 2001 → …

Publication series

Name	57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001

Other

Other	57th Automatic RF Techniques Group Conference, ARFTG Spring 2001
Country/Territory	United States
City	Phoenix
Period	5/25/01 → …

Bibliographical note

Funding Information:
The authors thank Daniel Amey of DuPont for his support and assistance. This work has been supported by an Automatic RF Techniques Group (ARFTG) Microwave Measurement Student Fellowship, a National Science Foundation Graduate Fellowship, and a Dupont Educational Aid Grant.

Publisher Copyright:
© 2001 IEEE.

Publisher link

10.1109/ARFTG.2001.327463

Find It

Find It at U of M Libraries

Cite this

Peterson, R. L., & Drayton, R. F. (2001). A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates. In 57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001 [4120164] (57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ARFTG.2001.327463

A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates. / Peterson, Rebecca L.; Drayton, Rhonda F.

57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001. Institute of Electrical and Electronics Engineers Inc., 2001. 4120164 (57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Peterson, RL & Drayton, RF 2001, A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates. in 57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001., 4120164, 57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001, Institute of Electrical and Electronics Engineers Inc., 57th Automatic RF Techniques Group Conference, ARFTG Spring 2001, Phoenix, United States, 5/25/01. https://doi.org/10.1109/ARFTG.2001.327463

Peterson RL, Drayton RF. A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates. In 57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001. Institute of Electrical and Electronics Engineers Inc. 2001. 4120164. (57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001). doi: 10.1109/ARFTG.2001.327463

Peterson, Rebecca L. ; Drayton, Rhonda F. / A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates. 57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001. Institute of Electrical and Electronics Engineers Inc., 2001. (57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001).

@inproceedings{e1d4a336899e462ca338ce2e96ed6196,

title = "A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates",

abstract = "The microstrip T-resonator is a well established tool for determining broadband electrical properties of microwave materials, namely effective dielectric constant and attenuation. In this paper finite ground coplanar waveguide (CPW) T-resonators on high resistivity silicon are presented and evaluated. The multi-moding seen in CPW T-junctions is effectively eliminated through the use of gold wire bonds. The calibration independence of the CPW T-resonator technique is demonstrated and the predicted impedance independence of the CPW {"}T{"} is experimentally validated. The electrical property results obtained using the T-resonator on high resistivity silicon substrates are in good agreement with data from other characterization techniques. The CPW T-resonator is thus shown to provide rapid and accurate characterization of integrated microwave substrates.",

author = "Peterson, {Rebecca L.} and Drayton, {Rhonda F.}",

note = "Funding Information: The authors thank Daniel Amey of DuPont for his support and assistance. This work has been supported by an Automatic RF Techniques Group (ARFTG) Microwave Measurement Student Fellowship, a National Science Foundation Graduate Fellowship, and a Dupont Educational Aid Grant. Publisher Copyright: {\textcopyright} 2001 IEEE.; 57th Automatic RF Techniques Group Conference, ARFTG Spring 2001 ; Conference date: 25-05-2001",

year = "2001",

doi = "10.1109/ARFTG.2001.327463",

language = "English (US)",

series = "57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "57th ARFTG Conference Digest Spring 2001",

}

TY - GEN

T1 - A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates

AU - Peterson, Rebecca L.

AU - Drayton, Rhonda F.

N1 - Funding Information: The authors thank Daniel Amey of DuPont for his support and assistance. This work has been supported by an Automatic RF Techniques Group (ARFTG) Microwave Measurement Student Fellowship, a National Science Foundation Graduate Fellowship, and a Dupont Educational Aid Grant. Publisher Copyright: © 2001 IEEE.

PY - 2001

Y1 - 2001

N2 - The microstrip T-resonator is a well established tool for determining broadband electrical properties of microwave materials, namely effective dielectric constant and attenuation. In this paper finite ground coplanar waveguide (CPW) T-resonators on high resistivity silicon are presented and evaluated. The multi-moding seen in CPW T-junctions is effectively eliminated through the use of gold wire bonds. The calibration independence of the CPW T-resonator technique is demonstrated and the predicted impedance independence of the CPW "T" is experimentally validated. The electrical property results obtained using the T-resonator on high resistivity silicon substrates are in good agreement with data from other characterization techniques. The CPW T-resonator is thus shown to provide rapid and accurate characterization of integrated microwave substrates.

AB - The microstrip T-resonator is a well established tool for determining broadband electrical properties of microwave materials, namely effective dielectric constant and attenuation. In this paper finite ground coplanar waveguide (CPW) T-resonators on high resistivity silicon are presented and evaluated. The multi-moding seen in CPW T-junctions is effectively eliminated through the use of gold wire bonds. The calibration independence of the CPW T-resonator technique is demonstrated and the predicted impedance independence of the CPW "T" is experimentally validated. The electrical property results obtained using the T-resonator on high resistivity silicon substrates are in good agreement with data from other characterization techniques. The CPW T-resonator is thus shown to provide rapid and accurate characterization of integrated microwave substrates.

UR - http://www.scopus.com/inward/record.url?scp=84962343721&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84962343721&partnerID=8YFLogxK

U2 - 10.1109/ARFTG.2001.327463

DO - 10.1109/ARFTG.2001.327463

M3 - Conference contribution

AN - SCOPUS:84962343721

T3 - 57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001

BT - 57th ARFTG Conference Digest Spring 2001

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 57th Automatic RF Techniques Group Conference, ARFTG Spring 2001

Y2 - 25 May 2001

ER -

A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates

Abstract

Publication series

Other

Bibliographical note

Publisher link

Find It

Other files and links

Fingerprint

Cite this