A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing

Gyusung Park; Minsu Kim; Nakul Pande; Po Wei Chiu; Jeehwan Song; Chris H. Kim

doi:10.1109/CICC.2019.8780279

A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing

Gyusung Park
, Minsu Kim
, Nakul Pande
, Po Wei Chiu
, Jeehwan Song
, Chris H. Kim

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Scopus citations

Abstract

In this paper, we present a counter based measurement circuit for in-situ characterization of analog-to-digital converter (ADC) differential non-linearity (DNL) and integral non-linearity (INL). An array of counters collects the histogram of the ADC output code for a triangular input voltage. Since the ADC operation and data transfer operation are separated in time, the DNL and INL results are immune to noise in the measurement setup. Using the proposed characterization method, we studied short-term bias temperature instability (BTI) effects in a successive-approximate-register ADC under different operating conditions.

Original language	English (US)
Title of host publication	2019 IEEE Custom Integrated Circuits Conference, CICC 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781538693957
DOIs	https://doi.org/10.1109/CICC.2019.8780279
State	Published - Apr 2019
Event	40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019 - Austin, United States Duration: Apr 14 2019 → Apr 17 2019

Publication series

Name	Proceedings of the Custom Integrated Circuits Conference
Volume	2019-April
ISSN (Print)	0886-5930

Conference

Conference	40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019
Country/Territory	United States
City	Austin
Period	4/14/19 → 4/17/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

Keywords

Counter
DNL
INL
In-situ
SAR-ADC
bias temperature instability
device aging
reliability

Publisher link

10.1109/CICC.2019.8780279

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Park, G., Kim, M., Pande, N., Chiu, P. W., Song, J., & Kim, C. H. (2019). A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. In 2019 IEEE Custom Integrated Circuits Conference, CICC 2019 Article 8780279 (Proceedings of the Custom Integrated Circuits Conference; Vol. 2019-April). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CICC.2019.8780279

A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. / Park, Gyusung; Kim, Minsu; Pande, Nakul et al.
2019 IEEE Custom Integrated Circuits Conference, CICC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. 8780279 (Proceedings of the Custom Integrated Circuits Conference; Vol. 2019-April).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Park, G, Kim, M, Pande, N, Chiu, PW, Song, J & Kim, CH 2019, A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. in 2019 IEEE Custom Integrated Circuits Conference, CICC 2019., 8780279, Proceedings of the Custom Integrated Circuits Conference, vol. 2019-April, Institute of Electrical and Electronics Engineers Inc., 40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019, Austin, United States, 4/14/19. https://doi.org/10.1109/CICC.2019.8780279

Park G, Kim M, Pande N, Chiu PW, Song J, Kim CH. A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. In 2019 IEEE Custom Integrated Circuits Conference, CICC 2019. Institute of Electrical and Electronics Engineers Inc. 2019. 8780279. (Proceedings of the Custom Integrated Circuits Conference). doi: 10.1109/CICC.2019.8780279

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abstract = "In this paper, we present a counter based measurement circuit for in-situ characterization of analog-to-digital converter (ADC) differential non-linearity (DNL) and integral non-linearity (INL). An array of counters collects the histogram of the ADC output code for a triangular input voltage. Since the ADC operation and data transfer operation are separated in time, the DNL and INL results are immune to noise in the measurement setup. Using the proposed characterization method, we studied short-term bias temperature instability (BTI) effects in a successive-approximate-register ADC under different operating conditions.",

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KW - INL

KW - In-situ

KW - SAR-ADC

KW - bias temperature instability

KW - device aging

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A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing

Abstract

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Keywords

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