In this paper, we present a counter based measurement circuit for in-situ characterization of analog-to-digital converter (ADC) differential non-linearity (DNL) and integral non-linearity (INL). An array of counters collects the histogram of the ADC output code for a triangular input voltage. Since the ADC operation and data transfer operation are separated in time, the DNL and INL results are immune to noise in the measurement setup. Using the proposed characterization method, we studied short-term bias temperature instability (BTI) effects in a successive-approximate-register ADC under different operating conditions.
|Original language||English (US)|
|Title of host publication||2019 IEEE Custom Integrated Circuits Conference, CICC 2019|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|State||Published - Apr 2019|
|Event||40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019 - Austin, United States|
Duration: Apr 14 2019 → Apr 17 2019
|Name||Proceedings of the Custom Integrated Circuits Conference|
|Conference||40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019|
|Period||4/14/19 → 4/17/19|
Bibliographical noteFunding Information:
The authors would like to thank Dr. Vijay Reddy and Dr. Srikanth Krishnan at Texas Instruments for their technical feedback. This work was supported in part by the Semiconductor Research Corporation and the Texas Analog Center of Excellence (TxACE).
© 2019 IEEE.
- bias temperature instability
- device aging