A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing

Gyusung Park, Minsu Kim, Nakul Pande, Po Wei Chiu, Jeehwan Song, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we present a counter based measurement circuit for in-situ characterization of analog-to-digital converter (ADC) differential non-linearity (DNL) and integral non-linearity (INL). An array of counters collects the histogram of the ADC output code for a triangular input voltage. Since the ADC operation and data transfer operation are separated in time, the DNL and INL results are immune to noise in the measurement setup. Using the proposed characterization method, we studied short-term bias temperature instability (BTI) effects in a successive-approximate-register ADC under different operating conditions.

Original languageEnglish (US)
Title of host publication2019 IEEE Custom Integrated Circuits Conference, CICC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538693957
DOIs
StatePublished - Apr 1 2019
Event40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019 - Austin, United States
Duration: Apr 14 2019Apr 17 2019

Publication series

NameProceedings of the Custom Integrated Circuits Conference
Volume2019-April
ISSN (Print)0886-5930

Conference

Conference40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019
CountryUnited States
CityAustin
Period4/14/194/17/19

Fingerprint

Digital to analog conversion
Networks (circuits)
Testing
Data transfer
Electric potential
Temperature

Keywords

  • bias temperature instability
  • Counter
  • device aging
  • DNL
  • In-situ
  • INL
  • reliability
  • SAR-ADC

Cite this

Park, G., Kim, M., Pande, N., Chiu, P. W., Song, J., & Kim, C. H. (2019). A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. In 2019 IEEE Custom Integrated Circuits Conference, CICC 2019 [8780279] (Proceedings of the Custom Integrated Circuits Conference; Vol. 2019-April). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CICC.2019.8780279

A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. / Park, Gyusung; Kim, Minsu; Pande, Nakul; Chiu, Po Wei; Song, Jeehwan; Kim, Chris H.

2019 IEEE Custom Integrated Circuits Conference, CICC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. 8780279 (Proceedings of the Custom Integrated Circuits Conference; Vol. 2019-April).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Park, G, Kim, M, Pande, N, Chiu, PW, Song, J & Kim, CH 2019, A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. in 2019 IEEE Custom Integrated Circuits Conference, CICC 2019., 8780279, Proceedings of the Custom Integrated Circuits Conference, vol. 2019-April, Institute of Electrical and Electronics Engineers Inc., 40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019, Austin, United States, 4/14/19. https://doi.org/10.1109/CICC.2019.8780279
Park G, Kim M, Pande N, Chiu PW, Song J, Kim CH. A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. In 2019 IEEE Custom Integrated Circuits Conference, CICC 2019. Institute of Electrical and Electronics Engineers Inc. 2019. 8780279. (Proceedings of the Custom Integrated Circuits Conference). https://doi.org/10.1109/CICC.2019.8780279
Park, Gyusung ; Kim, Minsu ; Pande, Nakul ; Chiu, Po Wei ; Song, Jeehwan ; Kim, Chris H. / A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. 2019 IEEE Custom Integrated Circuits Conference, CICC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. (Proceedings of the Custom Integrated Circuits Conference).
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