A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing

Gyusung Park; Minsu Kim; Nakul Pande; Po Wei Chiu; Jeehwan Song; Chris H. Kim

doi:10.1109/CICC.2019.8780279

A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing

Gyusung Park, Minsu Kim, Nakul Pande, Po Wei Chiu, Jeehwan Song, Chris H. Kim

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

In this paper, we present a counter based measurement circuit for in-situ characterization of analog-to-digital converter (ADC) differential non-linearity (DNL) and integral non-linearity (INL). An array of counters collects the histogram of the ADC output code for a triangular input voltage. Since the ADC operation and data transfer operation are separated in time, the DNL and INL results are immune to noise in the measurement setup. Using the proposed characterization method, we studied short-term bias temperature instability (BTI) effects in a successive-approximate-register ADC under different operating conditions.

Original language	English (US)
Title of host publication	2019 IEEE Custom Integrated Circuits Conference, CICC 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781538693957
DOIs	https://doi.org/10.1109/CICC.2019.8780279
State	Published - Apr 2019
Event	40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019 - Austin, United States Duration: Apr 14 2019 → Apr 17 2019

Publication series

Name	Proceedings of the Custom Integrated Circuits Conference
Volume	2019-April
ISSN (Print)	0886-5930

Conference

Conference	40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019
Country/Territory	United States
City	Austin
Period	4/14/19 → 4/17/19

Bibliographical note

Funding Information:
The authors would like to thank Dr. Vijay Reddy and Dr. Srikanth Krishnan at Texas Instruments for their technical feedback. This work was supported in part by the Semiconductor Research Corporation and the Texas Analog Center of Excellence (TxACE).

Publisher Copyright:
© 2019 IEEE.

Keywords

Counter
DNL
INL
In-situ
SAR-ADC
bias temperature instability
device aging
reliability

Publisher link

10.1109/CICC.2019.8780279

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Cite this

Park, G., Kim, M., Pande, N., Chiu, P. W., Song, J., & Kim, C. H. (2019). A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. In 2019 IEEE Custom Integrated Circuits Conference, CICC 2019 Article 8780279 (Proceedings of the Custom Integrated Circuits Conference; Vol. 2019-April). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CICC.2019.8780279

A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. / Park, Gyusung; Kim, Minsu; Pande, Nakul et al.
2019 IEEE Custom Integrated Circuits Conference, CICC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. 8780279 (Proceedings of the Custom Integrated Circuits Conference; Vol. 2019-April).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Park, G, Kim, M, Pande, N, Chiu, PW, Song, J & Kim, CH 2019, A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. in 2019 IEEE Custom Integrated Circuits Conference, CICC 2019., 8780279, Proceedings of the Custom Integrated Circuits Conference, vol. 2019-April, Institute of Electrical and Electronics Engineers Inc., 40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019, Austin, United States, 4/14/19. https://doi.org/10.1109/CICC.2019.8780279

Park G, Kim M, Pande N, Chiu PW, Song J, Kim CH. A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing. In 2019 IEEE Custom Integrated Circuits Conference, CICC 2019. Institute of Electrical and Electronics Engineers Inc. 2019. 8780279. (Proceedings of the Custom Integrated Circuits Conference). doi: 10.1109/CICC.2019.8780279

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title = "A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing",

abstract = "In this paper, we present a counter based measurement circuit for in-situ characterization of analog-to-digital converter (ADC) differential non-linearity (DNL) and integral non-linearity (INL). An array of counters collects the histogram of the ADC output code for a triangular input voltage. Since the ADC operation and data transfer operation are separated in time, the DNL and INL results are immune to noise in the measurement setup. Using the proposed characterization method, we studied short-term bias temperature instability (BTI) effects in a successive-approximate-register ADC under different operating conditions.",

keywords = "Counter, DNL, INL, In-situ, SAR-ADC, bias temperature instability, device aging, reliability",

author = "Gyusung Park and Minsu Kim and Nakul Pande and Chiu, {Po Wei} and Jeehwan Song and Kim, {Chris H.}",

note = "Funding Information: The authors would like to thank Dr. Vijay Reddy and Dr. Srikanth Krishnan at Texas Instruments for their technical feedback. This work was supported in part by the Semiconductor Research Corporation and the Texas Analog Center of Excellence (TxACE). Publisher Copyright: {\textcopyright} 2019 IEEE.; 40th Annual IEEE Custom Integrated Circuits Conference, CICC 2019 ; Conference date: 14-04-2019 Through 17-04-2019",

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AU - Kim, Chris H.

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N2 - In this paper, we present a counter based measurement circuit for in-situ characterization of analog-to-digital converter (ADC) differential non-linearity (DNL) and integral non-linearity (INL). An array of counters collects the histogram of the ADC output code for a triangular input voltage. Since the ADC operation and data transfer operation are separated in time, the DNL and INL results are immune to noise in the measurement setup. Using the proposed characterization method, we studied short-term bias temperature instability (BTI) effects in a successive-approximate-register ADC under different operating conditions.

AB - In this paper, we present a counter based measurement circuit for in-situ characterization of analog-to-digital converter (ADC) differential non-linearity (DNL) and integral non-linearity (INL). An array of counters collects the histogram of the ADC output code for a triangular input voltage. Since the ADC operation and data transfer operation are separated in time, the DNL and INL results are immune to noise in the measurement setup. Using the proposed characterization method, we studied short-term bias temperature instability (BTI) effects in a successive-approximate-register ADC under different operating conditions.

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KW - SAR-ADC

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A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing

Abstract

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Bibliographical note

Keywords

Publisher link

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