A Calibration-Free Synthesizable Odometer Featuring Automatic Frequency Dead Zone Escape and Start-up Glitch Removal

Tahmida Islam; Junkyu Kim; Chris H. Kim; David Tipple; Michael Nelson; Robert Jin; Anis Jarrar

doi:10.1109/IRPS48227.2022.9764518

A Calibration-Free Synthesizable Odometer Featuring Automatic Frequency Dead Zone Escape and Start-up Glitch Removal

Tahmida Islam, Junkyu Kim, Chris H. Kim, David Tipple, Michael Nelson, Robert Jin, Anis Jarrar

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper presents a synthesized version of the silicon odometer aging sensor for measuring the frequency degradation caused by device degradation mechanisms in high volume semiconductor products. In the design, three ring oscillators (ROSCs) composed of inverter, NAND, and NOR gates are implemented in register-transfer-level (RTL), with the ability to be stressed in an AC or DC stress condition. The new odometer has product level features such as calibration-free operation, automatic frequency dead zone escape, and start-up glitch removal. The odometer verilog code was synthesized and automatically placed-and-routed in three different technologies using standard ASIC design tools. As a proof of concept, we show aging data collected from a 65nm test chip with 12 synthesized odometer instances. The open-source RTL files and testbench of the synthesizable odometer can be downloaded from https://github.com/reliability-research/odometer.

Original language	English (US)
Title of host publication	2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	P21-P26
ISBN (Electronic)	9781665479509
DOIs	https://doi.org/10.1109/IRPS48227.2022.9764518
State	Published - 2022
Event	2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Dallas, United States Duration: Mar 27 2022 → Mar 31 2022

Publication series

Name	2022 IEEE International Reliability Physics Symposium (IRPS)

Conference

Conference	2022 IEEE International Reliability Physics Symposium, IRPS 2022
Country/Territory	United States
City	Dallas
Period	3/27/22 → 3/31/22

Bibliographical note

Funding Information:
ACKNOWLEDGMENT This work was supported in part by Semiconductor Research Corporation Task No. 2810.070 through the Texas Analog Center of Excellence (TxACE).

Publisher Copyright:
© 2022 IEEE.

Keywords

ASIC
RTL
Silicon odometer
aging sensor
ring oscillators
synthesized

Publisher link

10.1109/IRPS48227.2022.9764518

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Islam, T., Kim, J., Kim, C. H., Tipple, D., Nelson, M., Jin, R., & Jarrar, A. (2022). A Calibration-Free Synthesizable Odometer Featuring Automatic Frequency Dead Zone Escape and Start-up Glitch Removal. In 2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings (pp. P21-P26). (2022 IEEE International Reliability Physics Symposium (IRPS)). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IRPS48227.2022.9764518

A Calibration-Free Synthesizable Odometer Featuring Automatic Frequency Dead Zone Escape and Start-up Glitch Removal. / Islam, Tahmida; Kim, Junkyu; Kim, Chris H. et al.
2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2022. p. P21-P26 (2022 IEEE International Reliability Physics Symposium (IRPS)).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Islam, T, Kim, J, Kim, CH, Tipple, D, Nelson, M, Jin, R & Jarrar, A 2022, A Calibration-Free Synthesizable Odometer Featuring Automatic Frequency Dead Zone Escape and Start-up Glitch Removal. in 2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings. 2022 IEEE International Reliability Physics Symposium (IRPS), Institute of Electrical and Electronics Engineers Inc., pp. P21-P26, 2022 IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, United States, 3/27/22. https://doi.org/10.1109/IRPS48227.2022.9764518

Islam T, Kim J, Kim CH, Tipple D, Nelson M, Jin R et al. A Calibration-Free Synthesizable Odometer Featuring Automatic Frequency Dead Zone Escape and Start-up Glitch Removal. In 2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2022. p. P21-P26. (2022 IEEE International Reliability Physics Symposium (IRPS)). doi: 10.1109/IRPS48227.2022.9764518

Islam, Tahmida ; Kim, Junkyu ; Kim, Chris H. et al. / A Calibration-Free Synthesizable Odometer Featuring Automatic Frequency Dead Zone Escape and Start-up Glitch Removal. 2022 IEEE International Reliability Physics Symposium, IRPS 2022 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2022. pp. P21-P26 (2022 IEEE International Reliability Physics Symposium (IRPS)).

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abstract = "This paper presents a synthesized version of the silicon odometer aging sensor for measuring the frequency degradation caused by device degradation mechanisms in high volume semiconductor products. In the design, three ring oscillators (ROSCs) composed of inverter, NAND, and NOR gates are implemented in register-transfer-level (RTL), with the ability to be stressed in an AC or DC stress condition. The new odometer has product level features such as calibration-free operation, automatic frequency dead zone escape, and start-up glitch removal. The odometer verilog code was synthesized and automatically placed-and-routed in three different technologies using standard ASIC design tools. As a proof of concept, we show aging data collected from a 65nm test chip with 12 synthesized odometer instances. The open-source RTL files and testbench of the synthesizable odometer can be downloaded from https://github.com/reliability-research/odometer.",

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AB - This paper presents a synthesized version of the silicon odometer aging sensor for measuring the frequency degradation caused by device degradation mechanisms in high volume semiconductor products. In the design, three ring oscillators (ROSCs) composed of inverter, NAND, and NOR gates are implemented in register-transfer-level (RTL), with the ability to be stressed in an AC or DC stress condition. The new odometer has product level features such as calibration-free operation, automatic frequency dead zone escape, and start-up glitch removal. The odometer verilog code was synthesized and automatically placed-and-routed in three different technologies using standard ASIC design tools. As a proof of concept, we show aging data collected from a 65nm test chip with 12 synthesized odometer instances. The open-source RTL files and testbench of the synthesizable odometer can be downloaded from https://github.com/reliability-research/odometer.

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A Calibration-Free Synthesizable Odometer Featuring Automatic Frequency Dead Zone Escape and Start-up Glitch Removal

Abstract

Publication series

Conference

Bibliographical note

Keywords

Publisher link

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