### Abstract

In this paper, the design of a C-testable, high-performance carry-free array divider is presented. A radix-2 redundant number based carry-free divider is considered and is modified to make it C-testable, i.e., it can be exhaustively tested using a constant number of test vectors irrespective of its word-length. Previous C-testable designs considered dividers which used carry-propagate adders/subtractors. These dividers are slow because of their O(W^{2}) computation time (where W is the word-length of the divider). High-performance carry-free dividers use carry-free redundant arithmetic adders/subtractors. Due to this feature, they have O(W) computation time. The on-the-fly converter used by carry-free dividers to convert the redundant quotient to two’s-complement form is shown to be not C-testable. It is modified to be linear-testable (in word-length) instead of exponential time required for exhaustive testing of all possible combinations at its inputs. We conclude that the number of test vectors needed is 99 for C-testing of the divider array and (3W+ 10) for linear testing of the converter. The hardware overhead required to make the divider C-testable and the on-the-fly converter linear testable is also shown to be nominal.

Original language | English (US) |
---|---|

Pages (from-to) | 472-488 |

Number of pages | 17 |

Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |

Volume | 2 |

Issue number | 4 |

DOIs | |

State | Published - Jan 1 1994 |

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### Cite this

*IEEE Transactions on Very Large Scale Integration (VLSI) Systems*,

*2*(4), 472-488. https://doi.org/10.1109/92.335015

**A C-Testable Carry-Free Divider.** / Srinivas, H. R.; Vinnakota, Bapiraju; Parhi, Keshab K.

Research output: Contribution to journal › Article

*IEEE Transactions on Very Large Scale Integration (VLSI) Systems*, vol. 2, no. 4, pp. 472-488. https://doi.org/10.1109/92.335015

}

TY - JOUR

T1 - A C-Testable Carry-Free Divider

AU - Srinivas, H. R.

AU - Vinnakota, Bapiraju

AU - Parhi, Keshab K

PY - 1994/1/1

Y1 - 1994/1/1

N2 - In this paper, the design of a C-testable, high-performance carry-free array divider is presented. A radix-2 redundant number based carry-free divider is considered and is modified to make it C-testable, i.e., it can be exhaustively tested using a constant number of test vectors irrespective of its word-length. Previous C-testable designs considered dividers which used carry-propagate adders/subtractors. These dividers are slow because of their O(W2) computation time (where W is the word-length of the divider). High-performance carry-free dividers use carry-free redundant arithmetic adders/subtractors. Due to this feature, they have O(W) computation time. The on-the-fly converter used by carry-free dividers to convert the redundant quotient to two’s-complement form is shown to be not C-testable. It is modified to be linear-testable (in word-length) instead of exponential time required for exhaustive testing of all possible combinations at its inputs. We conclude that the number of test vectors needed is 99 for C-testing of the divider array and (3W+ 10) for linear testing of the converter. The hardware overhead required to make the divider C-testable and the on-the-fly converter linear testable is also shown to be nominal.

AB - In this paper, the design of a C-testable, high-performance carry-free array divider is presented. A radix-2 redundant number based carry-free divider is considered and is modified to make it C-testable, i.e., it can be exhaustively tested using a constant number of test vectors irrespective of its word-length. Previous C-testable designs considered dividers which used carry-propagate adders/subtractors. These dividers are slow because of their O(W2) computation time (where W is the word-length of the divider). High-performance carry-free dividers use carry-free redundant arithmetic adders/subtractors. Due to this feature, they have O(W) computation time. The on-the-fly converter used by carry-free dividers to convert the redundant quotient to two’s-complement form is shown to be not C-testable. It is modified to be linear-testable (in word-length) instead of exponential time required for exhaustive testing of all possible combinations at its inputs. We conclude that the number of test vectors needed is 99 for C-testing of the divider array and (3W+ 10) for linear testing of the converter. The hardware overhead required to make the divider C-testable and the on-the-fly converter linear testable is also shown to be nominal.

UR - http://www.scopus.com/inward/record.url?scp=0028712726&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028712726&partnerID=8YFLogxK

U2 - 10.1109/92.335015

DO - 10.1109/92.335015

M3 - Article

AN - SCOPUS:0028712726

VL - 2

SP - 472

EP - 488

JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems

JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems

SN - 1063-8210

IS - 4

ER -