Keyphrases
Low Power
100%
Caching
100%
High Density
100%
On-die
100%
Gain Cell
100%
EDRAM
100%
Bitline
75%
Wordline
50%
Data Retention Time
50%
Monte Carlo Simulation
25%
Circuit Techniques
25%
Current-voltage
25%
Steady State
25%
Reading Performance
25%
Measurement Results
25%
PVT Variations
25%
CMOS Process
25%
Logic Compatible
25%
Storage Node
25%
Conventional Design
25%
Six Sigma
25%
Writing Performance
25%
Reading Speed
25%
PMOS
25%
Low Leakage
25%
Read Margin
25%
Die-to-die
25%
Voltage Sense Amplifier
25%
Write Disturbance
25%
Bias Generator
25%
Reference Bias
25%
Node Voltage
25%
Static Power Dissipation
25%
Voltage Monitor
25%
Random Cycle Times
25%
Engineering
Bit Line
100%
Data Retention
66%
Retention Time
66%
Energy Dissipation
33%
Sense Amplifier
33%
Node Voltage
33%