Abstract
This paper presents a high-resolution, area- and power-efficient successive approximate register (SAR) analog-to-digital converter (ADC) for high precision nerve recording. The design features a new "half-split" feedback digital-to-analog converter (DAC) capacitor array with integrated digital calibrations, which allow automatic estimation and calibration of capacitor mismatches. As a result, the SAR ADC precision can be substantially improved given the constraints on circuits area and power consumption. The design has been fabricated in a 0.13μm CMOS process with a core area of 0.17mm2 (280μmx620μm). When measured at 40kSample/s, the ADC consumes 10μW of power and achieves a 72.7dB signal-to-noise-plus-distortion ratio (SNDR) and a 92.1dB spurious free dynamic range (SFDR) over the Nyquist bandwidth. Compared with the noncalibrated ADC, the proposed methods provide the improvements on SNDR, SFDR, and nonlinearity by 12.6dB, 22.7dB, and 4-6 times, respectively.
| Original language | English (US) |
|---|---|
| Title of host publication | 2015 IEEE Custom Integrated Circuits Conference, CICC 2015 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781479986828 |
| DOIs | |
| State | Published - Nov 25 2015 |
| Event | IEEE Custom Integrated Circuits Conference, CICC 2015 - San Jose, United States Duration: Sep 28 2015 → Sep 30 2015 |
Publication series
| Name | Proceedings of the Custom Integrated Circuits Conference |
|---|---|
| Volume | 2015-November |
| ISSN (Print) | 0886-5930 |
Other
| Other | IEEE Custom Integrated Circuits Conference, CICC 2015 |
|---|---|
| Country/Territory | United States |
| City | San Jose |
| Period | 9/28/15 → 9/30/15 |
Bibliographical note
Publisher Copyright:© 2015 IEEE.
Keywords
- High-resolution SAR ADC
- capacitor mismatches estimation and calibration
- half-split DAC array
- high precision nerve recording
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