This paper presents a subthreshold frequency reference-less temperature sensor. Compared with the previous designs that rely on external frequency references or excessive analog blocks, this work proposes a novel subthreshold ratioed-current/delay sensor core and hybrid-domain all-digital processing technique, which eliminates the dependence on frequency reference and is scalable to technology feature size. Our sensor has been fabricated in a 65-nm CMOS process and occupies a total area of 0.022mm2. Measurement results from 8 test chips have shown that the maximum inaccuracy is -1.6oC/+1oC across 0oC to 100oC with power consumption of 280-nW at 0.4V.
|Original language||English (US)|
|Title of host publication||2014 IEEE Asian Solid-State Circuits Conference, A-SSCC - Proceedings of Technical Papers|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||4|
|State||Published - Jan 13 2015|
|Event||2014 10th IEEE Asian Solid-State Circuits Conference, A-SSCC 2014 - Kaohsiung, Taiwan, Province of China|
Duration: Nov 10 2014 → Nov 12 2014
|Name||2014 IEEE Asian Solid-State Circuits Conference, A-SSCC - Proceedings of Technical Papers|
|Conference||2014 10th IEEE Asian Solid-State Circuits Conference, A-SSCC 2014|
|Country/Territory||Taiwan, Province of China|
|Period||11/10/14 → 11/12/14|
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© 2014 IEEE.