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2018
Integrated circuits
Networks (circuits)
Ethernet
Fast Fourier transforms
Hardware
2017
Phase locked loops
Phase noise
Capacitors
Tuning
Detectors

A 10Gb/s 10mm on-chip serial link in 65nm CMOS featuring a half-rate time-based decision feedback equalizer

Chiu, P. W., Kundu, S., Tang, Q. & Kim, C. H. Aug 10 2017 2017 Symposium on VLSI Circuits, VLSI Circuits 2017. Institute of Electrical and Electronics Engineers Inc., p. C56-C57 8008546

Research output: ResearchConference contribution

Decision feedback equalizers
Bit error rate
Energy efficiency
Transmitters

A Circuit-Based Approach for Characterizing High Frequency Electromigration Effects

Zhou, C., Wang, X., Fung, R., Wen, S. J., Wong, R. & Kim, C. H. Dec 1 2017 In : IEEE Transactions on Device and Materials Reliability. 17, 4, p. 763-772 10 p., 8103067

Research output: Research - peer-reviewArticle

Electromigration
Networks (circuits)
Metals
Variable frequency oscillators
Testing

A compact high-sensitivity 2-Transistor radiation sensor array

Tang, Q., Kumar, S., Kim, C. H. & Fulkerson, D. E. May 30 2017 2017 International Reliability Physics Symposium, IRPS 2017. Institute of Electrical and Electronics Engineers Inc., p. SE7.1-SE7.4 7936408

Research output: ResearchConference contribution

Sensor arrays
Transistors
Radiation
Sensors
Static random access storage

A data remanence based approach to generate 100% stable keys from an SRAM physical unclonable function

Liu, M., Zhou, C., Tang, Q., Parhi, K. K. & Kim, C. H. Aug 11 2017 ISLPED 2017 - IEEE/ACM International Symposium on Low Power Electronics and Design. Institute of Electrical and Electronics Engineers Inc., 8009192

Research output: ResearchConference contribution

Remanence
Static random access storage
Hardware security
Aging of materials
Networks (circuits)

A DRAM based physical unclonable function capable of generating >1032 Challenge Response Pairs per 1Kbit array for secure chip authentication

Tang, Q., Zhou, C., Choi, W., Kang, G., Park, J., Parhi, K. K. & Kim, C. H. Jul 26 2017 38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017. Institute of Electrical and Electronics Engineers Inc., Vol. 2017-April, 7993610

Research output: ResearchConference contribution

Dynamic random access storage
Authentication
Hardware security
Electric potential
Data storage equipment
4 Citations

Advanced spintronic memory and logic for non-volatile processors

Perricone, R., Ahmed, I., Liang, Z., Mankalale, M. G., Hu, X. S., Kim, C. H., Niemier, M., Sapatnekar, S. S. & Wang, J. P. May 11 2017 Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017. Institute of Electrical and Electronics Engineers Inc., p. 972-977 6 p. 7927132

Research output: ResearchConference contribution

Magnetoelectronics
Torque
Data storage equipment
Recovery
Energy harvesting

A multi-phase VCO quantizer based adaptive digital LDO in 65nm CMOS technology

Kundu, S. & Kim, C. H. Sep 25 2017 IEEE International Symposium on Circuits and Systems: From Dreams to Innovation, ISCAS 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 8050960

Research output: ResearchConference contribution

Variable frequency oscillators
Clocks
Sampling
Electric potential
Voltage regulators

An entropy test for determining whether a MUX PUF is linear or nonlinear

Koyily, A., Zhou, C., Kim, C. H. & Parhi, K. K. Sep 25 2017 IEEE International Symposium on Circuits and Systems: From Dreams to Innovation, ISCAS 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 8050670

Research output: ResearchConference contribution

Entropy
2 Citations

A Pathway to Enable Exponential Scaling for the Beyond-CMOS Era: Invited

Wang, J. P., Sapatnekar, S. S., Kim, C. H., Crowell, P., Koester, S., Datta, S., Roy, K., Raghunathan, A., Hu, X. S., Niemier, M., Naeemi, A., Chien, C. L., Ross, C. & Kawakami, R. Jun 18 2017 Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017. Institute of Electrical and Electronics Engineers Inc., Vol. Part 128280, 16

Research output: ResearchConference contribution

Pathway
Scaling
Transistors
Computing
Data storage equipment

A powerless and non-volatile counterfeit IC detection sensor in a standard logic process based on an exposed floating-gate array

Liu, M. & Kim, C. H. Jul 31 2017 2017 Symposium on VLSI Technology, VLSI Technology 2017. Institute of Electrical and Electronics Engineers Inc., p. T102-T103 7998211

Research output: ResearchConference contribution

Sensors
Supply chains
Particles (particulate matter)
Dust
Atmospheric humidity

A scalable time-based integrate-and-fire neuromorphic core with brain-inspired leak and local lateral inhibition capabilities

Liu, M., Everson, L. R. & Kim, C. H. Jul 26 2017 38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017. Institute of Electrical and Electronics Engineers Inc., Vol. 2017-April, 7993627

Research output: ResearchConference contribution

Digital circuits
Brain
Fires
Pixels
Throughput

Characterizing the Impact of RTN on Logic and SRAM Operation Using a Dual Ring Oscillator Array Circuit

Tang, Q. & Kim, C. H. Jun 1 2017 In : IEEE Journal of Solid-State Circuits. 52, 6, p. 1655-1663 9 p., 7892967

Research output: Research - peer-reviewArticle

Telegraph
Static random access storage
Networks (circuits)
Electric potential
Delay circuits
1 Citations

Hierarchical functional obfuscation of integratec circuits using a mode-based approach

Koteshwara, S., Kim, C. H. & Parhi, K. K. Sep 25 2017 IEEE International Symposium on Circuits and Systems: From Dreams to Innovation, ISCAS 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 8050319

Research output: ResearchConference contribution

Networks (circuits)
Intellectual property
Reverse engineering
Convolution
Fast Fourier transforms

Predicting hard and soft-responses and identifying stable challenges of MUX PUFs using ANNs

Avvaru, S. V. S., Zhou, C., Kim, C. H. & Parhi, K. K. Sep 27 2017 2017 IEEE 60th International Midwest Symposium on Circuits and Systems, MWSCAS 2017. Institute of Electrical and Electronics Engineers Inc., Vol. 2017-August, p. 934-937 4 p. 8053078

Research output: ResearchConference contribution

Hardware security
Neural networks
Networks (circuits)

Reliable PUF-Based Local Authentication With Self-Correction

Lao, Y., Yuan, B., Kim, C. H. & Parhi, K. K. Feb 1 2017 In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 36, 2, p. 201-213 13 p., 7470631

Research output: Research - peer-reviewArticle

Authentication
Hardware security
Finite automata
Integrated circuits
Foundries

Secure and Reliable XOR Arbiter PUF Design: An Experimental Study based on 1 Trillion Challenge Response Pair Measurements

Zhou, C., Parhi, K. K. & Kim, C. H. Jun 18 2017 Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017. Institute of Electrical and Electronics Engineers Inc., Vol. Part 128280, 10

Research output: ResearchConference contribution

Experimental Study
Chip
Hardware
Output
Design

Solution-processed carbon nanotube true random number generator

Gaviria Rojas, W. A., McMorrow, J. J., Geier, M. L., Tang, Q., Kim, C. H., Marks, T. J. & Hersam, M. C. Aug 9 2017 In : Nano Letters. 17, 8, p. 4976-4981 6 p.

Research output: Research - peer-reviewArticle

Carbon Nanotubes
Single-walled carbon nanotubes (SWCN)
Carbon nanotubes
random numbers
generators

Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

Kumar, S., Cho, M., Everson, L., Kim, H., Tang, Q., Mazanec, P., Meinerzhagen, P., Malavasi, A., Lake, D., Tokunaga, C., Quinn, H., Khellah, M., Tschanz, J., Borkar, S., De, V. & Kim, C. H. Jul 31 2017 2017 Symposium on VLSI Technology, VLSI Technology 2017. Institute of Electrical and Electronics Engineers Inc., p. C114-C115 7998134

Research output: ResearchConference contribution

Flip flop circuits
Scalability
Sampling
Radiation
Networks (circuits)

Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

Kumar, S., Cho, M., Eversen, L., Kim, H., Tang, Q., Mazanec, P., Meinerzhagen, P., Malavasi, A., Lake, D., Tokunaga, C., Quinn, H., Khellah, M., Tschanz, J., Borkar, S., De, V. & Kim, C. H. Aug 10 2017 2017 Symposium on VLSI Circuits, VLSI Circuits 2017. Institute of Electrical and Electronics Engineers Inc., p. C114-C115 8008570

Research output: ResearchConference contribution

Flip flop circuits
Scalability
Buffers
Sampling
Radiation
2016
Frequency synthesizers
Capacitors
Jitter
Clocks
Networks (circuits)
6 Citations

A 0.2-to-1.45GHz subsampling fractional-N all-digital MDLL with zero-offset aperture PD-based spur cancellation and in-situ timing mismatch detection

Kundu, S., Kim, B. & Kim, C. H. Feb 23 2016 2016 IEEE International Solid-State Circuits Conference, ISSCC 2016. Institute of Electrical and Electronics Engineers Inc., Vol. 59, p. 326-327 2 p. 7418039

Research output: ResearchConference contribution

Detectors
Phase locked loops
Electric power utilization
Networks (circuits)
Error compensation
Detectors
Statistical methods
Jitter
Networks (circuits)
Costs
4 Citations

Dynamic Memory Cells Using MoS2 Field-Effect Transistors Demonstrating Femtoampere Leakage Currents

Kshirsagar, C. U., Xu, W., Su, Y., Robbins, M. C., Kim, C. H. & Koester, S. J. Sep 27 2016 In : ACS Nano. 10, 9, p. 8457-8464 8 p.

Research output: Research - peer-reviewArticle

Field effect transistors
Leakage currents
Transistors
Data storage equipment
leakage
5 Citations

Estimating delay differences of arbiter PUFs using silicon data

Avvaru, S. V. S., Zhou, C., Satapathy, S., Lao, Y., Kim, C. H. & Parhi, K. K. Apr 25 2016 Proceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016. Institute of Electrical and Electronics Engineers Inc., p. 543-546 4 p. 7459370

Research output: ResearchConference contribution

Silicon
Neural networks
Servers
Hardware security
Adaptive algorithms
2 Citations

Mode-based obfuscation using control-flow modifications

Koteshwara, S., Kim, C. H. & Parhi, K. K. Jan 20 2016 Proceedings of the 3rd Workshop on Cryptography and Security in Computing Systems, CS2 2016. Association for Computing Machinery, Vol. 20-January-2016, p. 19-24 6 p.

Research output: ResearchConference contribution

Flow control
Networks (circuits)
Digital signal processing
Fast Fourier transforms
Hardware security
3 Citations

System-Level Power Analysis of a Multicore Multipower Domain Processor with ON-Chip Voltage Regulators

Paul, A., Park, S. P., Somasekhar, D., Kim, Y. M., Borkar, N., Karpuzcu, U. R. & Kim, C. H. Dec 1 2016 In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24, 12, p. 3468-3476 9 p., 7468580

Research output: Research - peer-reviewArticle

Voltage regulators
Electric potential
Scheduling algorithms
Electric power utilization
Throughput
2015
1 Citations

A 0.4-1.6GHz spur-free bang-bang digital PLL in 65nm with a D-flip-flop based frequency subtractor circuit

Kim, B., Kundu, S. & Kim, C. H. Aug 31 2015 2015 Symposium on VLSI Circuits, VLSI Circuits 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-August, p. C140-C141 7231355

Research output: ResearchConference contribution

Flip flop circuits
Phase locked loops
Networks (circuits)
Phase noise
Jitter

A 8-14 GHz varactorless current controlled LC oscillator in 16nm CMOS technology

Kundu, S., Kireev, V. & Kim, C. H. Sep 28 2015 IEEE 58th International Midwest Symposium on Circuits and Systems: Climbing to New Heights, MWSCAS 2015 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-September, 7282096

Research output: ResearchConference contribution

Tuning
Varactors
Phase noise
Bias voltage
Capacitors
1 Citations

A comprehensive study on interface perpendicular MTJ variability

Choi, W. H., Kim, J., Ahmed, I. & Kim, C. H. Aug 3 2015 73rd Annual Device Research Conference, DRC 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-August, p. 89-90 2 p. 7175569

Research output: ResearchConference contribution

Tunnel junctions
Torque
Physics
SPICE
Anisotropy

A Magnetic Tunnel Junction based True Random Number Generator with conditional perturb and real-time output probability tracking

Choi, W. H., Lv, Y., Kim, J., Deshpande, A., Kang, G., Wang, J. P. & Kim, C. H. Jan 1 2015 In : Technical Digest - International Electron Devices Meeting, IEDM. 2015-February, February, p. 12.5.1-12.5.4 7047039

Research output: Research - peer-reviewArticle

Random number generation
Number theory
Electron devices
Tunnel junctions
Energy efficiency
2 Citations

An 8bit, 2.6ps two-step TDC in 65nm CMOS employing a switched ring-oscillator based time amplifier

Kim, B., Kim, H. & Kim, C. H. Nov 25 2015 2015 IEEE Custom Integrated Circuits Conference, CICC 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-November, 7338425

Research output: ResearchConference contribution

Calibration

An 8-bit Analog-to-Digital Converter based on the voltage-dependent switching probability of a Magnetic Tunnel Junction

Choi, W. H., Lv, Y., Kim, H., Wang, J. P. & Kim, C. H. Aug 25 2015 Digest of Technical Papers - Symposium on VLSI Technology. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-August, p. T162-T163 7223662

Research output: ResearchConference contribution

Tunnel junctions
Digital to analog conversion
Electric potential
Sampling
Networks (circuits)
2 Citations

A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients

Satapathy, S., Choi, W. H., Wang, X. & Kim, C. H. Jan 1 2015 2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-May, p. 6A31-6A35 7112757

Research output: ResearchConference contribution

Sampling
Degradation
Networks (circuits)
Temperature
Recovery
1 Citations

A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology

Kim, T. T. H., Lu, P. F., Jenkins, K. A. & Kim, C. H. Jul 1 2015 In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 23, 7, p. 1360-1364 5 p., 6872552

Research output: Research - peer-reviewArticle

Degradation
Metals
Temperature
Negative bias temperature instability
Digital circuits
3 Citations

Assessing the impact of RTN on logic timing margin using a 32nm dual ring oscillator array

Tang, Q. & Kim, C. H. Feb 16 2015 2015 IEEE International Electron Devices Meeting, IEDM 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2016-February, p. 20.7.1-20.7.4 7409745

Research output: ResearchConference contribution

logic
margins
time measurement
oscillators
rings
12 Citations

A technology-agnostic MTJ SPICE model with user-defined dimensions for STT-MRAM scalability studies

Kim, J., Chen, A., Behin-Aein, B., Kumar, S., Wang, J. P. & Kim, C. H. Nov 25 2015 2015 IEEE Custom Integrated Circuits Conference, CICC 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-November, 7338407

Research output: ResearchConference contribution

Tunnel junctions
SPICE
Scalability
Torque

Circuit techniques for mitigating short-term vth instability issues in successive approximation register (SAR) ADCs

Choi, W. H., Kim, H. & Kim, C. H. Nov 25 2015 2015 IEEE Custom Integrated Circuits Conference, CICC 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-November, 7338417

Research output: ResearchConference contribution

Networks (circuits)
Recovery
Degradation
Temperature
3 Citations

Fault-tolerant ripple-carry binary adder using partial triple modular redundancy (PTMR)

Parhi, R., Kim, C. H. & Parhi, K. K. Jan 1 2015 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-July, p. 41-44 4 p. 7168565

Research output: ResearchConference contribution

Adders
Redundancy
Hardware
Numbering systems
Electromigration
1 Citations

High frequency AC electromigration lifetime measurements from a 32nm test chip

Zhou, C., Wang, X., Fung, R., Wen, S. J., Wong, R. & Kim, C. H. Aug 25 2015 Digest of Technical Papers - Symposium on VLSI Technology. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-August, p. T42-T43 7223696

Research output: ResearchConference contribution

Electromigration
Networks (circuits)
Testing
Metals
Experiments
25 Citations

Large-area, low-voltage, antiambipolar heterojunctions from solution-processed semiconductors

Jariwala, D., Sangwan, V. K., Seo, J. W. T., Xu, W., Smith, J., Kim, C. H., Lauhon, L. J., Marks, T. J. & Hersam, M. C. Jan 14 2015 In : Nano Letters. 15, 1, p. 416-421 6 p.

Research output: Research - peer-reviewArticle

low voltage
heterojunctions
electronics
Heterojunctions
Semiconductor materials

Overstress-free 4 × VDD switch in a generic logic process supporting high and low voltage modes

Song, S. H., Kim, J. & Kim, C. H. Dec 1 2015 In : Journal of Semiconductor Technology and Science. 15, 6, p. 664-670 7 p.

Research output: Research - peer-reviewArticle

Switches
Electric potential
Time switches
Transistors
Pumps
61 Citations

Solution-processed carbon nanotube thin-film complementary static random access memory

Geier, M. L., McMorrow, J. J., Xu, W., Zhu, J., Kim, C. H., Marks, T. J. & Hersam, M. C. Nov 1 2015 In : Nature Nanotechnology. 10, 11, p. 944-948 5 p.

Research output: Research - peer-reviewArticle

Carbon Nanotubes
Single-walled carbon nanotubes (SWCN)
Data storage equipment
Thin films
Carbon nanotubes
48 Citations
Microprocessor chips
Metals
Oxide semiconductors
Magnetoelectronics
2 Citations

Spin-Hall effect MRAM based cache memory: A feasibility study

Kim, J., Tuohy, B., Ma, C., Choi, W. H., Ahmed, I., Lilja, D. & Kim, C. H. Aug 3 2015 73rd Annual Device Research Conference, DRC 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-August, p. 117-118 2 p. 7175583

Research output: ResearchConference contribution

Spin Hall effect
Cache memory
Benchmarking
Data storage equipment
Networks (circuits)
3 Citations

The dependence of BTI and HCI-induced frequency degradation on interconnect length and its circuit level implications

Wang, X., Tang, Q., Jain, P., Jiao, D. & Kim, C. H. Feb 1 2015 In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 23, 2, p. 280-291 12 p.

Research output: Research - peer-reviewArticle

Hot carriers
Degradation
Networks (circuits)
Temperature
Electric potential

Two-step beat frequency quantizer based ADC with adaptive reference control for low swing bio-potential signals

Kundu, S., Kim, B. & Kim, C. H. Nov 25 2015 2015 IEEE Custom Integrated Circuits Conference, CICC 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-November, 7338382

Research output: ResearchConference contribution

Sampling
6 Citations

Wettability Contrast Gravure Printing

Zhang, H., Ramm, A., Lim, S., Xie, W., Ahn, B. Y., Xu, W., Mahajan, A., Suszynski, W. J., Kim, C., Lewis, J. A., Frisbie, C. D. & Francis, L. F. Dec 2 2015 In : Advanced Materials. 27, 45, p. 7420-7425 6 p.

Research output: Research - peer-reviewArticle

Ink
Wetting
Printing
Silicon
Silicon Dioxide
2014
6 Citations

A bit-by-bit re-writable eflash in a generic 65 nm logic process for moderate-density nonvolatile memory applications

Song, S. H., Chun, K. C. & Kim, C. H. Jan 1 2014 In : IEEE Journal of Solid-State Circuits. 49, 8, p. 1861-1871 11 p., 6799274

Research output: Research - peer-reviewArticle

Data storage equipment
Electric potential
Flash memory
Electric fuses
Charge pump circuits