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2018

A 65-nm 10-Gb/s 10-mm On-Chip Serial Link Featuring a Digital-Intensive Time-Based Decision Feedback Equalizer

Chiu, P. W., Kundu, S., Tang, Q. & Kim, C. H. Apr 1 2018 In : IEEE Journal of Solid-State Circuits. 53, 4, p. 1203-1213 11 p.

Research output: Contribution to journalArticle

Decision feedback equalizers
Bit error rate
Binary sequences
Equalizers
Energy efficiency

A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning

Kundu, S., Liu, M., Wong, R., Wen, S. J. & Kim, C. H. Mar 8 2018 2018 IEEE International Solid-State Circuits Conference, ISSCC 2018. Institute of Electrical and Electronics Engineers Inc., Vol. 61, p. 308-310 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Capacitors
Sampling
Electric potential
Electric power utilization
Response time (computer systems)

All-digital PLL frequency and phase noise degradation measurements using simple on-chip monitoring circuits

Park, G., Kim, M., Kim, C. H., Kim, B. & Reddy, V. May 25 2018 2018 IEEE International Reliability Physics Symposium, IRPS 2018. Institute of Electrical and Electronics Engineers Inc., Vol. 2018-March, p. 5C.21-5C.26

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Phase locked loops
Phase noise
Degradation
Networks (circuits)
Monitoring

An ultra-dense irradiation test structure with a NAND/NOR readout chain for characterizing soft error rates of 14nm combinational logic circuits

Kumar, S., Cho, M., Everson, L., Kim, H., Tang, Q., Mazanec, P., Meinerzhagen, P., Malavasi, A., Lake, D., Tokunaga, C., Khellah, M., Tschanz, J., Borkar, S., De, V. & Kim, C. H. Jan 23 2018 2017 IEEE International Electron Devices Meeting, IEDM 2017. Institute of Electrical and Electronics Engineers Inc., p. 39.3.1-39.3.4

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Combinatorial circuits
logic circuits
Logic circuits
readout
Logic gates

Effect of aging on linear and nonlinear MUX PUFs by statistical modeling

Koyily, A., Avvaru, S. V. S., Zhou, C., Kim, C. H. & Parhi, K. K. Feb 20 2018 ASP-DAC 2018 - 23rd Asia and South Pacific Design Automation Conference, Proceedings. Institute of Electrical and Electronics Engineers Inc., Vol. 2018-January, p. 76-83 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Aging of materials
Authentication
Hardware security
Random variables
Tuning
3 Citations
Integrated circuits
Networks (circuits)
Ethernet
Fast Fourier transforms
Hardware

Low-Energy deep belief networks using intrinsic sigmoidal spintronic-based probabilistic neurons

Zand, R., Camsari, K. Y., Pyle, S. D., Ahmed, I., Kim, C. H. & DeMara, R. F. May 30 2018 GLSVLSI 2018 - Proceedings of the 2018 Great Lakes Symposium on VLSI. Association for Computing Machinery, Vol. Part F137141, p. 15-20 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Magnetoelectronics
Bayesian networks
Neurons
Logic devices
Networks (circuits)
2017
2 Citations
Phase locked loops
Phase noise
Capacitors
Tuning
Detectors
1 Citations

A 10Gb/s 10mm on-chip serial link in 65nm CMOS featuring a half-rate time-based decision feedback equalizer

Chiu, P. W., Kundu, S., Tang, Q. & Kim, C. H. Aug 10 2017 2017 Symposium on VLSI Circuits, VLSI Circuits 2017. Institute of Electrical and Electronics Engineers Inc., p. C56-C57 8008546

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Decision feedback equalizers
Bit error rate
Energy efficiency
Transmitters

A Circuit-Based Approach for Characterizing High Frequency Electromigration Effects

Zhou, C., Wang, X., Fung, R., Wen, S. J., Wong, R. & Kim, C. H. Dec 1 2017 In : IEEE Transactions on Device and Materials Reliability. 17, 4, p. 763-772 10 p., 8103067

Research output: Contribution to journalArticle

Electromigration
Networks (circuits)
Metals
Variable frequency oscillators
Testing

A compact high-sensitivity 2-Transistor radiation sensor array

Tang, Q., Kumar, S., Kim, C. H. & Fulkerson, D. E. May 30 2017 2017 International Reliability Physics Symposium, IRPS 2017. Institute of Electrical and Electronics Engineers Inc., p. SE7.1-SE7.4 7936408

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sensor arrays
Transistors
Radiation
Static random access storage
Sensors
2 Citations

A data remanence based approach to generate 100% stable keys from an SRAM physical unclonable function

Liu, M., Zhou, C., Tang, Q., Parhi, K. K. & Kim, C. H. Aug 11 2017 ISLPED 2017 - IEEE/ACM International Symposium on Low Power Electronics and Design. Institute of Electrical and Electronics Engineers Inc., 8009192

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Remanence
Static random access storage
Aging of materials
Networks (circuits)
Hardware security
1 Citations

A DRAM based physical unclonable function capable of generating >1032 Challenge Response Pairs per 1Kbit array for secure chip authentication

Tang, Q., Zhou, C., Choi, W., Kang, G., Park, J., Parhi, K. K. & Kim, C. H. Jul 26 2017 38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017. Institute of Electrical and Electronics Engineers Inc., Vol. 2017-April, 7993610

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Dynamic random access storage
Authentication
Electric potential
Data storage equipment
Hardware security
5 Citations

Advanced spintronic memory and logic for non-volatile processors

Perricone, R., Ahmed, I., Liang, Z., Mankalale, M. G., Hu, X. S., Kim, C. H., Niemier, M., Sapatnekar, S. S. & Wang, J. P. May 11 2017 Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017. Institute of Electrical and Electronics Engineers Inc., p. 972-977 6 p. 7927132

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Magnetoelectronics
Torque
Data storage equipment
Recovery
Energy harvesting

A multi-phase VCO quantizer based adaptive digital LDO in 65nm CMOS technology

Kundu, S. & Kim, C. H. Sep 25 2017 IEEE International Symposium on Circuits and Systems: From Dreams to Innovation, ISCAS 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 8050960

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Variable frequency oscillators
Clocks
Sampling
Voltage regulators
Electric potential

An entropy test for determining whether a MUX PUF is linear or nonlinear

Koyily, A., Zhou, C., Kim, C. H. & Parhi, K. K. Sep 25 2017 IEEE International Symposium on Circuits and Systems: From Dreams to Innovation, ISCAS 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 8050670

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Entropy
2 Citations

A Pathway to Enable Exponential Scaling for the Beyond-CMOS Era: Invited

Wang, J. P., Sapatnekar, S. S., Kim, C. H., Crowell, P., Koester, S., Datta, S., Roy, K., Raghunathan, A., Hu, X. S., Niemier, M., Naeemi, A., Chien, C. L., Ross, C. & Kawakami, R. Jun 18 2017 Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017. Institute of Electrical and Electronics Engineers Inc., Vol. Part 128280, 16

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Pathway
Scaling
Transistors
Data storage equipment
Computing
1 Citations

A powerless and non-volatile counterfeit IC detection sensor in a standard logic process based on an exposed floating-gate array

Liu, M. & Kim, C. H. Jul 31 2017 2017 Symposium on VLSI Technology, VLSI Technology 2017. Institute of Electrical and Electronics Engineers Inc., p. T102-T103 7998211

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sensors
Supply chains
Particles (particulate matter)
Dust
Atmospheric humidity

A scalable time-based integrate-and-fire neuromorphic core with brain-inspired leak and local lateral inhibition capabilities

Liu, M., Everson, L. R. & Kim, C. H. Jul 26 2017 38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017. Institute of Electrical and Electronics Engineers Inc., Vol. 2017-April, 7993627

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Digital circuits
Brain
Fires
Pixels
Throughput
1 Citations

Characterizing the Impact of RTN on Logic and SRAM Operation Using a Dual Ring Oscillator Array Circuit

Tang, Q. & Kim, C. H. Jun 1 2017 In : IEEE Journal of Solid-State Circuits. 52, 6, p. 1655-1663 9 p., 7892967

Research output: Contribution to journalArticle

Telegraph
Static random access storage
Networks (circuits)
Delay circuits
Electric potential
1 Citations

Hierarchical functional obfuscation of integratec circuits using a mode-based approach

Koteshwara, S., Kim, C. H. & Parhi, K. K. Sep 25 2017 IEEE International Symposium on Circuits and Systems: From Dreams to Innovation, ISCAS 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 8050319

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Intellectual property
Reverse engineering
Convolution
Fast Fourier transforms
1 Citations

Predicting hard and soft-responses and identifying stable challenges of MUX PUFs using ANNs

Avvaru, S. V. S., Zhou, C., Kim, C. H. & Parhi, K. K. Sep 27 2017 2017 IEEE 60th International Midwest Symposium on Circuits and Systems, MWSCAS 2017. Institute of Electrical and Electronics Engineers Inc., Vol. 2017-August, p. 934-937 4 p. 8053078

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Neural networks
Networks (circuits)
Hardware security
2 Citations

Reliable PUF-Based Local Authentication With Self-Correction

Lao, Y., Yuan, B., Kim, C. H. & Parhi, K. K. Feb 1 2017 In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 36, 2, p. 201-213 13 p., 7470631

Research output: Contribution to journalArticle

Authentication
Finite automata
Integrated circuits
Foundries
Hardware security
1 Citations

Secure and Reliable XOR Arbiter PUF Design: An Experimental Study based on 1 Trillion Challenge Response Pair Measurements

Zhou, C., Parhi, K. K. & Kim, C. H. Jun 18 2017 Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017. Institute of Electrical and Electronics Engineers Inc., Vol. Part 128280, 10

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Design of experiments
Experimental Study
Chip
Hardware
Output
2 Citations

Solution-processed carbon nanotube true random number generator

Gaviria Rojas, W. A., McMorrow, J. J., Geier, M. L., Tang, Q., Kim, C. H., Marks, T. J. & Hersam, M. C. Aug 9 2017 In : Nano letters. 17, 8, p. 4976-4981 6 p.

Research output: Contribution to journalArticle

random numbers
Carbon Nanotubes
Single-walled carbon nanotubes (SWCN)
Carbon nanotubes
generators

Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

Kumar, S., Cho, M., Eversen, L., Kim, H., Tang, Q., Mazanec, P., Meinerzhagen, P., Malavasi, A., Lake, D., Tokunaga, C., Quinn, H., Khellah, M., Tschanz, J., Borkar, S., De, V. & Kim, C. H. Aug 10 2017 2017 Symposium on VLSI Circuits, VLSI Circuits 2017. Institute of Electrical and Electronics Engineers Inc., p. C114-C115 8008570

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Flip flop circuits
Scalability
Buffers
Sampling
Radiation

Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

Kumar, S., Cho, M., Everson, L., Kim, H., Tang, Q., Mazanec, P., Meinerzhagen, P., Malavasi, A., Lake, D., Tokunaga, C., Quinn, H., Khellah, M., Tschanz, J., Borkar, S., De, V. & Kim, C. H. Jul 31 2017 2017 Symposium on VLSI Technology, VLSI Technology 2017. Institute of Electrical and Electronics Engineers Inc., p. C114-C115 7998134

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Flip flop circuits
Scalability
Sampling
Radiation
Networks (circuits)
2016
Frequency synthesizers
Capacitors
Jitter
Clocks
Crystal oscillators
7 Citations

A 0.2-to-1.45GHz subsampling fractional-N all-digital MDLL with zero-offset aperture PD-based spur cancellation and in-situ timing mismatch detection

Kundu, S., Kim, B. & Kim, C. H. Feb 23 2016 2016 IEEE International Solid-State Circuits Conference, ISSCC 2016. Institute of Electrical and Electronics Engineers Inc., Vol. 59, p. 326-327 2 p. 7418039

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Detectors
Phase locked loops
Electric power utilization
Error compensation
Networks (circuits)
1 Citations
Detectors
Statistical methods
Jitter
Networks (circuits)
Costs
6 Citations

Dynamic Memory Cells Using MoS2 Field-Effect Transistors Demonstrating Femtoampere Leakage Currents

Kshirsagar, C. U., Xu, W., Su, Y., Robbins, M. C., Kim, C. H. & Koester, S. J. Sep 27 2016 In : ACS Nano. 10, 9, p. 8457-8464 8 p.

Research output: Contribution to journalArticle

Field effect transistors
Leakage currents
Transistors
leakage
transistors
7 Citations

Estimating delay differences of arbiter PUFs using silicon data

Avvaru, S. V. S., Zhou, C., Satapathy, S., Lao, Y., Kim, C. H. & Parhi, K. K. Apr 25 2016 Proceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016. Institute of Electrical and Electronics Engineers Inc., p. 543-546 4 p. 7459370

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon
Neural networks
Servers
Adaptive algorithms
Probability density function
3 Citations

Mode-based obfuscation using control-flow modifications

Koteshwara, S., Kim, C. H. & Parhi, K. K. Jan 20 2016 Proceedings of the 3rd Workshop on Cryptography and Security in Computing Systems, CS2 2016. Association for Computing Machinery, Vol. 20-January-2016, p. 19-24 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Flow control
Digital signal processing
Fast Fourier transforms
Networks (circuits)
Reverse engineering
6 Citations

Soft Response Generation and Thresholding Strategies for Linear and Feed-Forward MUX PUFs

Zhou, C., Satapathy, S., Lao, Y., Parhi, K. K. & Kim, C. H. Aug 8 2016 ISLPED 2016 - Proceedings of the 2016 International Symposium on Low Power Electronics and Design. Institute of Electrical and Electronics Engineers Inc., p. 124-129 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated circuit layout
Authentication
Hardware security
Hardware
Networks (circuits)
3 Citations

System-Level Power Analysis of a Multicore Multipower Domain Processor with ON-Chip Voltage Regulators

Paul, A., Park, S. P., Somasekhar, D., Kim, Y. M., Borkar, N., Karpuzcu, U. R. & Kim, C. H. Dec 1 2016 In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24, 12, p. 3468-3476 9 p., 7468580

Research output: Contribution to journalArticle

Voltage regulators
Electric potential
Scheduling algorithms
Electric power utilization
Throughput
2015
3 Citations

A 0.4-1.6GHz spur-free bang-bang digital PLL in 65nm with a D-flip-flop based frequency subtractor circuit

Kim, B., Kundu, S. & Kim, C. H. Aug 31 2015 2015 Symposium on VLSI Circuits, VLSI Circuits 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-August, p. C140-C141 7231355

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Flip flop circuits
Phase locked loops
Networks (circuits)
Phase noise
Jitter

A 8-14 GHz varactorless current controlled LC oscillator in 16nm CMOS technology

Kundu, S., Kireev, V. & Kim, C. H. Sep 28 2015 IEEE 58th International Midwest Symposium on Circuits and Systems: Climbing to New Heights, MWSCAS 2015 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-September, 7282096

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tuning
Varactors
Phase noise
Bias voltage
Capacitors
1 Citations

A comprehensive study on interface perpendicular MTJ variability

Choi, W. H., Kim, J., Ahmed, I. & Kim, C. H. Aug 3 2015 73rd Annual Device Research Conference, DRC 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-August, p. 89-90 2 p. 7175569

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tunnel junctions
Torque
Physics
SPICE
Anisotropy
19 Citations

A Magnetic Tunnel Junction based True Random Number Generator with conditional perturb and real-time output probability tracking

Choi, W. H., Lv, Y., Kim, J., Deshpande, A., Kang, G., Wang, J. P. & Kim, C. H. Jan 1 2015 In : Technical Digest - International Electron Devices Meeting, IEDM. 2015-February, February, p. 12.5.1-12.5.4 7047039

Research output: Contribution to journalArticle

Random number generation
number theory
Number theory
Electron devices
random numbers
3 Citations

An 8bit, 2.6ps two-step TDC in 65nm CMOS employing a switched ring-oscillator based time amplifier

Kim, B., Kim, H. & Kim, C. H. Nov 25 2015 2015 IEEE Custom Integrated Circuits Conference, CICC 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-November, 7338425

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Calibration
2 Citations

An 8-bit Analog-to-Digital Converter based on the voltage-dependent switching probability of a Magnetic Tunnel Junction

Choi, W. H., Lv, Y., Kim, H., Wang, J. P. & Kim, C. H. Aug 25 2015 2015 Symposium on VLSI Technology, VLSI Technology 2015 - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-August, p. T162-T163 7223662

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tunnel junctions
Digital to analog conversion
Electric potential
Sampling
Networks (circuits)
6 Citations

A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients

Satapathy, S., Choi, W. H., Wang, X. & Kim, C. H. Jan 1 2015 2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-May, p. 6A31-6A35 7112757

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sampling
Degradation
Networks (circuits)
Recovery
Temperature
5 Citations

A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology

Kim, T. T. H., Lu, P. F., Jenkins, K. A. & Kim, C. H. Jul 1 2015 In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 23, 7, p. 1360-1364 5 p., 6872552

Research output: Contribution to journalArticle

Degradation
Metals
Digital circuits
Temperature
Negative bias temperature instability
4 Citations

Assessing the impact of RTN on logic timing margin using a 32nm dual ring oscillator array

Tang, Q. & Kim, C. H. Feb 16 2015 2015 IEEE International Electron Devices Meeting, IEDM 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2016-February, p. 20.7.1-20.7.4 7409745

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Telegraph
logic
margins
time measurement
oscillators
13 Citations

A technology-agnostic MTJ SPICE model with user-defined dimensions for STT-MRAM scalability studies

Kim, J., Chen, A., Behin-Aein, B., Kumar, S., Wang, J. P. & Kim, C. H. Nov 25 2015 2015 IEEE Custom Integrated Circuits Conference, CICC 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-November, 7338407

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tunnel junctions
SPICE
Scalability
Torque

Circuit techniques for mitigating short-term vth instability issues in successive approximation register (SAR) ADCs

Choi, W. H., Kim, H. & Kim, C. H. Nov 25 2015 2015 IEEE Custom Integrated Circuits Conference, CICC 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-November, 7338417

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Recovery
Degradation
Temperature
4 Citations

Fault-tolerant ripple-carry binary adder using partial triple modular redundancy (PTMR)

Parhi, R., Kim, C. H. & Parhi, K. K. Jan 1 2015 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-July, p. 41-44 4 p. 7168565

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Adders
Redundancy
Hardware
Numbering systems
Electromigration
1 Citations

High frequency AC electromigration lifetime measurements from a 32nm test chip

Zhou, C., Wang, X., Fung, R., Wen, S. J., Wong, R. & Kim, C. H. Aug 25 2015 2015 Symposium on VLSI Technology, VLSI Technology 2015 - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-August, p. T42-T43 7223696

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electromigration
Networks (circuits)
Testing
Metals
Experiments
32 Citations

Large-area, low-voltage, antiambipolar heterojunctions from solution-processed semiconductors

Jariwala, D., Sangwan, V. K., Seo, J. W. T., Xu, W., Smith, J., Kim, C. H., Lauhon, L. J., Marks, T. J. & Hersam, M. C. Jan 14 2015 In : Nano letters. 15, 1, p. 416-421 6 p.

Research output: Contribution to journalArticle

low voltage
Heterojunctions
heterojunctions
Semiconductor materials
gallium oxides

Overstress-free 4 × VDD switch in a generic logic process supporting high and low voltage modes

Song, S. H., Kim, J. & Kim, C. H. Dec 1 2015 In : Journal of Semiconductor Technology and Science. 15, 6, p. 664-670 7 p.

Research output: Contribution to journalArticle

Switches
Electric potential
Time switches
Transistors
Pumps